In-situ IR and spectroscopic ellipsometric analysis of growth process and structural properties of Ti1−xNbxO2 thin films by metal-organic chemical vapor deposition
1995 ◽
Vol 10
(9)
◽
pp. 2166-2169
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2004 ◽
Vol 110
(1)
◽
pp. 34-37
◽
2003 ◽
Vol 42
(Part 1, No. 5A)
◽
pp. 2839-2842
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