Some indentation and sliding experiments on single crystal and polycrystalline materials

Wear ◽  
2002 ◽  
Vol 252 (5-6) ◽  
pp. 401-429 ◽  
Author(s):  
Donald G Flom ◽  
Ranga Komanduri
Keyword(s):  
Single Crystal ◽  
Polycrystalline Materials

scholarly journals Bounds on the complex permittivity of polycrystalline materials by analytic continuation

2015 ◽  
Vol 471 (2174) ◽  
pp. 20140702 ◽  
Author(s):  
A. Gully ◽  
J. Lin ◽  
E. Cherkaev ◽  
K. M. Golden
Keyword(s):  
Sea Ice ◽  
Single Crystal ◽  
Analytic Continuation ◽  
Complex Permittivity ◽  
Crystal Orientation ◽  
Fluid Transport ◽  
Continuation Method ◽  
Growth Conditions ◽  
Polycrystalline Materials ◽  
Remote Sensing Techniques

An analytic continuation method for obtaining rigorous bounds on the effective complex permittivity ε * of polycrystalline composite materials is developed. It is assumed that the composite consists of many identical anisotropic crystals, each with a unique orientation. The key step in obtaining the bounds involves deriving an integral representation for ε *, which separates parameter information from geometrical information. Forward bounds are then found using knowledge of the single crystal permittivity tensor and mean crystal orientation. Inverse bounds are also developed, which recover information about the mean crystal orientation from ε *. We apply the polycrystalline bounds to sea ice, a critical component of the climate system. Different ice types, which result from different growth conditions, have different crystal orientation and size statistics. These characteristics significantly influence the fluid transport properties of sea ice, which control many geophysical and biogeochemical processes important to the climate and polar ecosystems. Using a two-scale homogenization scheme, where the single crystal tensor is numerically computed, forward bounds for sea ice are obtained and are in excellent agreement with columnar sea ice data. Furthermore, the inverse bounds are also applied to sea ice, helping to lay the groundwork for determining ice type using remote sensing techniques.

scholarly journals Use of Imaging Plates in X-Ray Analysis

1997 ◽  
Vol 29 (1-2) ◽  
pp. 89-101 ◽  
Author(s):  
M. Ermrich ◽  
F. Hahn ◽  
E. R. Wölfel
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Powder Diffraction ◽  
Polycrystalline Materials ◽  
Imaging Plate ◽  
Two Dimensional ◽  
X Ray ◽  
Working Principle ◽  
Imaging Plates

Two-dimensional detectors have opened a new area for the investigation of both single crystals and polycrystalline materials. The working principle of Imaging Plates is described. Some characteristics and the advantages of an Imaging Plate are discussed using the STOE Imaging Plate Diffraction System for different kinds of X-ray analysis: (i) single crystal diffractometry, (ii) powder diffraction and (iii) stress and texture investigations.

Synthesis of polycrystalline materials of SrWO4 and growth of its single crystal

2006 ◽  
Vol 1 (3) ◽  
pp. 264-267 ◽  
Author(s):  
Jiandong Fan ◽  
Huaijin Zhang ◽  
Zhengping Wang ◽  
Wenwei Ge ◽  
Jiyang Wang
Keyword(s):  
Single Crystal ◽  
Polycrystalline Materials

Electrical Transport Properties of the Pentatelluride Materials Hfte5 and Zrte5

1997 ◽  
Vol 478 ◽  
Author(s):  
T. M. Tritt ◽  
M. L. Wilson ◽  
R. L. Littleton ◽  
C. Feger ◽  
J. Kolis ◽  
...  
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Electrical Transport ◽  
Entire Range ◽  
Room Temperature ◽  
Polycrystalline Material ◽  
Polycrystalline Materials ◽  
Electrical Transport Properties ◽  
Low Dimensional ◽  
P Type

AbstractWe have measured the resistivity and thermopower of single crystals as well as polycrystalline pressed powders of the low-dimensional pentatelluride materials: HfTe5 and ZrTe5. We have performed these measurements as a function of temperature between 5K and 320K. In the single crystals there is a peak in the resistivity for both materials at a peak temperature, Tp where Tp ≈ 80K for HfTe5 and Tp ≈ 145K for ZrTe5. Both materials exhibit a large p-type thermopower around room temperature which undergoes a change to n-type below the peak. This data is similar to behavior observed previously in these materials. We have also synthesized pressed powders of polycrystalline pentatelluride materials, HfTe5 and ZrTe5. We have measured the resistivity and thermopower of these polycrystalline materials as a function of temperature between 5K and 320K. For the polycrystalline material, the room temperature thermopower for each of these materials is relatively high, +95 μV/K and +65 μV/K for HfTe5 and ZrTe5 respectively. These values compare closely to thermopower values for single crystals of these materials. At 77 K, the thermopower is +55 μV/K for HfTe5 and +35 μV/K for ZrTe5. In fact, the thermopower for the polycrystals decreases monotonically with temperature to T ≈ 5K, thus exhibiting p-type behavior over the entire range of temperature. As expected, the resistivity for the polycrystals is higher than the single crystal material, with values of 430 mΩ-cm and 24 mΩ-cm for Hfre5 and ZrTe5 respectively, compared to single crystal values of 0.35 mΩ-cm (HfTe5) and 1.0 mΩ-cm (ZrTe5). We have found that the peak in the resistivity evident in both single crystal materials is absent in these polycrystalline materials. We will discuss these materials in relation to their potential as candidates for thermoelectric applications.

Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method

1988 ◽  
Vol 32 ◽  
pp. 459-469 ◽  
Author(s):  
Masanori Kurita ◽  
Ikuo Ihara ◽  
Nobuyuki Ono
Keyword(s):  
Residual Stress ◽  
Single Crystal ◽  
Elastic Constants ◽  
Stress Measurement ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Small Areas ◽  
Curve Method ◽  
The Continuum

The residual stress induced by grinding or some thermal treatment has a large effect on the strength of ceramics. The X-ray technique can be used to nondestructively measure the residual stress in small areas on the surface of polycrystalline materials. The X-ray stress measurement is based on. the continuum mechanics for macroscopically isotropic polycrystalline materials. In this method, the stress value is calculated selectively from strains of a particular diffraction plane in the grains which are favorably oriented for the diffraction. In general, however, the elastic constants of a single crystal depend on the plane of the lattice, since a single crystal is anisotropic, The behavior of the deformation of individual crystals in the aggregate of polycrystalline materials under applied stress has not yet been solved successfully. Therefore, the stress constant and elastic constants for a particular diffracting plane should be determined experimentally in order to determine the residual stress accurately by X-ray diffraction.

scholarly journals Single Crystal Electrochemistry as an In Situ Analytical Characterization Tool

2020 ◽  
Vol 13 (1) ◽  
pp. 201-222 ◽  
Author(s):  
Víctor Climent ◽  
Juan Feliu
Keyword(s):  
Single Crystal ◽  
Polycrystalline Materials ◽  
Cyclic Voltammogram ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
Stepped Surfaces ◽  
Model Response ◽  
Platinum Single Crystal ◽  
Adsorption Processes

The electrochemical behavior of platinum single crystal surfaces can be taken as a model response for the interpretation of the activity of heterogeneous electrodes. The cyclic voltammogram of a given platinum electrode can be considered a fingerprint characteristic of the distribution of sites on its surface. We start this review by providing some simple mathematical descriptions of the voltammetric response in the presence of adsorption processes. We then describe the voltammogram of platinum basal planes, followed by the response of stepped surfaces. The voltammogram of polycrystalline materials can be understood as a composition of the response of the different basal contributions. Further resolution in the discrimination of different surface sites can be achieved with the aid of surface modification using adatoms such as bismuth or germanium. The application of these ideas is exemplified with the consideration of real catalysts composed of platinum nanoparticles with preferential shapes.

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