Ion beam assisted deposition of multi-layer X-ray mirrors for the extreme ultraviolet lithography

Author(s):  
T. Chassé ◽  
H. Neumann ◽  
B. Rauschenbach
2016 ◽  
Vol 852 ◽  
pp. 283-292
Author(s):  
Zheng Hang Xin ◽  
Chong Wang ◽  
Feng Qiu ◽  
Rong Fei Wang ◽  
Chen Li ◽  
...  

The recent process in the fabrication of the ordered Ge/Si quantum dots (QDs) is reviewed. The fabrication step generally started on the preparation of patterned substrate prepared in advance by using several interesting methods, such as photo lithography, focus ion beam (FIB), reactive ion etching (RIE), and extreme ultraviolet lithography (EUV-IL) et al, which are introduced briefly in this article. Here, we’d like to focus on the detailed process of nanosphere lithography (NSL) which has the advantages of less cost and higher product compared with the referred methods. The ordered Ge nanostructures always show as Hexagonal close-packed array on the patterned Si substrate and have the advantages of potential applications in electronic and optoelectronic devices.


2015 ◽  
Vol 22 (5) ◽  
pp. 1312-1318 ◽  
Author(s):  
Jih-Young Yuh ◽  
Shan-Wei Lin ◽  
Liang-Jen Huang ◽  
Hok-Sum Fung ◽  
Long-Life Lee ◽  
...  

During the last 20 years, beamline BL08B has been upgraded step by step from a photon beam-position monitor (BPM) to a testing beamline and a single-grating beamline that enables experiments to record X-ray photo-emission spectra (XPS) and X-ray absorption spectra (XAS) for research in solar physics, organic semiconductor materials and spinel oxides, with soft X-ray photon energies in the range 300–1000 eV. Demands for photon energy to extend to the extreme ultraviolet region for applications in nano-fabrication and topological thin films are increasing. The basic spherical-grating monochromator beamline was again upgraded by adding a second grating that delivers photons of energy from 80 to 420 eV. Four end-stations were designed for experiments with XPS, XAS, interstellar photoprocess systems (IPS) and extreme-ultraviolet lithography (EUVL) in the scheduled beam time. The data from these experiments show a large count rate in core levels probed and excellent statistics on background normalization in theL-edge adsorption spectrum.


2008 ◽  
Vol 516 (8) ◽  
pp. 2050-2057 ◽  
Author(s):  
Kenji Hiruma ◽  
Shinji Miyagaki ◽  
Hiromasa Yamanashi ◽  
Yuusuke Tanaka ◽  
Iwao Nishiyama

2004 ◽  
Vol 43 (36) ◽  
pp. 6545 ◽  
Author(s):  
Anton Barty ◽  
Stefan Hau-Riege ◽  
Dan Stearns ◽  
Miles Clift ◽  
Paul Mirkarimi ◽  
...  

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