Radiation damage in UO2 by swift heavy ions

Author(s):  
T. Wiss ◽  
Hj. Matzke ◽  
C. Trautmann ◽  
M. Toulemonde ◽  
S. Klaumünzer
2019 ◽  
Vol 58 (12) ◽  
pp. 120914 ◽  
Author(s):  
Wensi Ai ◽  
Lijun Xu ◽  
Shuai Nan ◽  
Pengfei Zhai ◽  
Weixing Li ◽  
...  

Ceramics ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 13-23
Author(s):  
Baurzhan Abyshev ◽  
Artem L. Kozlovskiy ◽  
Kassym Sh Zhumadilov ◽  
Alex V. Trukhanov

The work is devoted to the study of radiation damage and subsequent swelling processes of the surface layer of Li2ZrO3 ceramics under irradiation with heavy Xe22+ ions, depending on the accumulation of the radiation dose. The samples under study were obtained using a mechanochemical synthesis method. The samples were irradiated with heavy Xe22+ ions with an energy of 230 MeV at irradiation fluences of 1011–1016 ion/cm2. The choice of ion types is due to the possibility of simulating the radiation damage accumulation processes as a result of the implantation of Xe22+ ions and subsequent atomic displacements. It was found that, at irradiation doses above 5 × 1014 ion/cm2, point defects accumulate, which leads to a disordering of the surface layer and a subsequent decrease in the strength and hardness of ceramics. At the same time, the main process influencing the decrease in resistance to radiation damage is the crystal structure swelling as a result of the accumulation of defects and disordering of the crystal lattice.


2016 ◽  
Vol 90 ◽  
pp. 18-22 ◽  
Author(s):  
Ruslan Assylbayev ◽  
Abdirash Akilbekov ◽  
Alma Dauletbekova ◽  
Aleksandr Lushchik ◽  
Evgeni Shablonin ◽  
...  

Author(s):  
G.M. Baubekova ◽  
◽  
R.N. Asylbaev ◽  
Sh. Giniyatova ◽  
◽  
...  

2011 ◽  
Vol 166 (7) ◽  
pp. 513-521 ◽  
Author(s):  
M. Izerrouken ◽  
R. Bucher ◽  
A. Meftah ◽  
M. Maaza

Author(s):  
K. F. Russell ◽  
L. L. Horton

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.


2021 ◽  
Vol 4 (1) ◽  
Author(s):  
Miguel C. Sequeira ◽  
Jean-Gabriel Mattei ◽  
Henrique Vazquez ◽  
Flyura Djurabekova ◽  
Kai Nordlund ◽  
...  

AbstractGaN is the most promising upgrade to the traditional Si-based radiation-hard technologies. However, the underlying mechanisms driving its resistance are unclear, especially for strongly ionising radiation. Here, we use swift heavy ions to show that a strong recrystallisation effect induced by the ions is the key mechanism behind the observed resistance. We use atomistic simulations to examine and predict the damage evolution. These show that the recrystallisation lowers the expected damage levels significantly and has strong implications when studying high fluences for which numerous overlaps occur. Moreover, the simulations reveal structures such as point and extended defects, density gradients and voids with excellent agreement between simulation and experiment. We expect that the developed modelling scheme will contribute to improving the design and test of future radiation-resistant GaN-based devices.


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