Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

2001 ◽  
Vol 174 (3-4) ◽  
pp. 261-270 ◽  
Author(s):  
D Stapel ◽  
A Benninghoven
ACS Omega ◽  
2019 ◽  
Vol 4 (8) ◽  
pp. 13100-13105 ◽  
Author(s):  
Il Hee Kim ◽  
Byeong Jun Cha ◽  
Chang Min Choi ◽  
Jong Sung Jin ◽  
Myoung Choul Choi ◽  
...  

2006 ◽  
Vol 252 (19) ◽  
pp. 6844-6854 ◽  
Author(s):  
Emrys A. Jones ◽  
John S. Fletcher ◽  
Charlotte E. Thompson ◽  
Dean A. Jackson ◽  
Nicholas P. Lockyer ◽  
...  
Keyword(s):  
Tof Sims ◽  

Kobunshi ◽  
1999 ◽  
Vol 48 (9) ◽  
pp. 724-724
Author(s):  
Reiko SAITO ◽  
Masahiro KUDO

Author(s):  
Bruno Schueler ◽  
Robert W. Odom

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.


2008 ◽  
Vol 255 (5) ◽  
pp. 2388-2399 ◽  
Author(s):  
S. Achiwawanich ◽  
B.D. James ◽  
J. Liesegang
Keyword(s):  
Tof Sims ◽  

2006 ◽  
Vol 78 (6) ◽  
pp. 1827-1831 ◽  
Author(s):  
John S. Fletcher ◽  
Xavier A. Conlan ◽  
Emrys A. Jones ◽  
Greg Biddulph ◽  
Nicholas P. Lockyer ◽  
...  
Keyword(s):  
Tof Sims ◽  

2004 ◽  
Vol 231-232 ◽  
pp. 302-308 ◽  
Author(s):  
Zhengmao Zhu ◽  
Michael J. Kelley
Keyword(s):  
Tof Sims ◽  

BioResources ◽  
2016 ◽  
Vol 11 (2) ◽  
pp. 5581-5599
Author(s):  
Hong Yan Mou ◽  
Shubin Wu ◽  
Pedro Fardim

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass. In the current article, the application of ToF-SIMS to the characterization of the surface chemical composition and distribution of biomass components in lignocelluloses is reviewed. Moreover, extended applications of ToF-SIMS in the study of pretreatments, modification of biomaterials, and enzyme activity of lignocellulosic materials are presented and discussed. Sample preparation prior to ToF-SIMS analysis and subsequent interpretation of results is a critical factor in ensuring reliable results. The focus of this review is to give a comprehensive understanding of and offer new hints about the effects of processing conditions on the surface chemistry of lignocellulosic biomass.


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