(Photo)conductivity of conjugated oligomer films: mobile charge carrier formation by oxygen

1998 ◽  
Vol 9 (1-4) ◽  
pp. 454-460 ◽  
Author(s):  
L. Lüer ◽  
H.-J. Egelhaaf ◽  
D. Oelkrug
Keyword(s):  
Charge Carrier ◽  
Mobile Charge Carrier ◽  
Mobile Charge ◽  
Photo Conductivity

Extended-Drude Model to Fit Infrared Conductivity Cuprate Laser-Ablated Films

1998 ◽  
Vol 12 (29n31) ◽  
pp. 3323-3325 ◽  
Author(s):  
Sandrine Pessaud ◽  
Domingos De Sousa ◽  
Ricardo Lobo ◽  
François Gervais
Keyword(s):  
Charge Carrier ◽  
Optical Conductivity ◽  
Simple Form ◽  
The Self ◽  
Drude Model ◽  
Wide Spectral Range ◽  
Mobile Charge Carrier ◽  
Mobile Charge ◽  
Self Energy ◽  
Reflectivity Spectra

An "extended-Drude" model, implying a simple form for the self-energy function of the mobile charge-carrier response, has been applied to fitting the infrared and visible reflectivity spectra of simple cuprates. Excellent fits are obtained in a wide spectral range, from 4 meV to 4 eV, with a very restricted number of adjustable parameters. The optical conductivity obtained with this procedure is highly different from the Kramers–Kronig transformation of reflectivity spectra. The same procedure has been applied to characterise the infrared conductivity of multi-target laser-ablated films built via intergrowth of YBa2Cu3O7 and MCuO2 (M = Ca, Sr).

Theory of Metal-Solid Electrolyte Interface

1988 ◽  
Vol 135 ◽  
Author(s):  
S.I. Kim ◽  
M. Seidl
Keyword(s):  
Solid Electrolyte ◽  
Double Layer ◽  
Numerical Solutions ◽  
Metal Electrode ◽  
Mobile Charge Carrier ◽  
Mobile Charge ◽  
Potential Of Zero Charge ◽  
Electrode Interface ◽  
Free Parameters ◽  
Dc Current

AbstractA comprehensive time independent theory of the solid electrolyte(SE)–metal electrode interface is presented, using the assumption that cations are the only mobile charge carrier in the electrolyte. The temperature and the dc current across the SE are the only free parameters for the solutions along with three intrinsic parameters which depend on the properties of the particular system. The phenomenological model of the interface double layer is based on the Gouy–Chapman–Stern model.The numerical solutions of the theory for porous tungstenzeolite system enables us to predict most of the properties in the SE system such as;the current–overpotential characteristics, the capacitances of the double layer, concentration profile in the diffusion layer, the potential profile across the interface, electrochemical exchange current, and the potential of zero charge(PZC) etc. An experimental technique to measure the PZC of SE systems has been also proposed.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

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