High-resolution electron microscopy of Cu2O surfaces
1986 ◽
Vol 44
◽
pp. 396-397
Keyword(s):
System A
◽
In non-UHV microscope environments atomic surface structure has been observed for flat-on for various orientations of Au thin films and edge-on for columns of atoms in small particles. The problem of oxidation of surfaces has only recently been reported from the point of view of high resolution microscopy revealing surface reconstructions for the Ag2O system. A natural extension of these initial oxidation studies is to explore other materials areas which are technologically more significant such as that of Cu2O, which will now be described.
1990 ◽
Vol 48
(4)
◽
pp. 242-243
1986 ◽
Vol 116
(1)
◽
pp. 63-72
◽
1983 ◽
Vol 93
(2)
◽
pp. 449-450
◽
1987 ◽
Vol 59
(19)
◽
pp. 2177-2179
◽
1986 ◽
Vol 1
(1)
◽
pp. 47-59
◽
1983 ◽
Vol 41
◽
pp. 738-739
1983 ◽
Vol 41
◽
pp. 730-731