On the φ(ρz) Curves of Heterogeneous Materials

Quantitative X-Ray microanalysis is a well established technique for the chemical analysis of homogeneous materials having a flat surface. Precision better than 2% can be routinely obtained if the analysis is performed used the so called ZAF where standards of known composition must be used for all the elements presents in the system under analysis. However, real materials have generally different phases and their composition in a specific phase is not necessary homogeneous. Also, real materials may have surfaces that are not flat and where it is inappropriate to polish them, like a fractured or a corroded surface. It is therefore of paramount importance to develop quantitative schemes for such materials. The first step is to understand the shape of the φ(ρz) curves of heterogeneous materials. This paper present some of these curves that have been obtained with the Monte Carlo program CASINO available for free at www.gme.usherb.ca/casino.

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Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid Model

Microscopy and Microanalysis ◽

10.1017/s1431927620001531 ◽

2020 ◽

Vol 26 (3) ◽

pp. 484-496

Author(s):

Yu Yuan ◽

Hendrix Demers ◽

Xianglong Wang ◽

Raynald Gauvin

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Analytical Model ◽

Hybrid Model ◽

Three Dimensional ◽

Heterogeneous Materials ◽

X Ray ◽

The Monte Carlo Method ◽

Secondary Fluorescence ◽

Good Agreement

AbstractIn electron probe microanalysis or scanning electron microscopy, the Monte Carlo method is widely used for modeling electron transport within specimens and calculating X-ray spectra. For an accurate simulation, the calculation of secondary fluorescence (SF) is necessary, especially for samples with complex geometries. In this study, we developed a program, using a hybrid model that combines the Monte Carlo simulation with an analytical model, to perform SF correction for three-dimensional (3D) heterogeneous materials. The Monte Carlo simulation is performed using MC X-ray, a Monte Carlo program, to obtain the 3D primary X-ray distribution, which becomes the input of the analytical model. The voxel-based calculation of MC X-ray enables the model to be applicable to arbitrary samples. We demonstrate the derivation of the analytical model in detail and present the 3D X-ray distributions for both primary and secondary fluorescence to illustrate the capability of our program. Examples for non-diffusion couples and spherical inclusions inside matrices are shown. The results of our program are compared with experimental data from references and with results from other Monte Carlo codes. They are found to be in good agreement.

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APPENDIX F: PCXMC—A PC-BASED MONTE CARLO PROGRAM FOR CALCULATING PATIENT DOSES IN MEDICAL X-RAY EXAMINATIONS

Journal of the International Commission on Radiation Units and Measurements ◽

10.1093/jicru/ndi034 ◽

2005 ◽

Vol 5 (2) ◽

pp. 100-102 ◽

Cited By ~ 7

Keyword(s):

Monte Carlo ◽

Monte Carlo Program ◽

X Ray ◽

Patient Doses

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MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

Microscopy and Microanalysis ◽

10.1017/s1431927609092423 ◽

2009 ◽

Vol 15 (S2) ◽

pp. 488-489 ◽

Cited By ~ 38

Author(s):

R Gauvin ◽

P Michaud

Keyword(s):

Monte Carlo ◽

Monte Carlo Program ◽

X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Research on textile materials for X-ray shielding

E3S Web of Conferences ◽

10.1051/e3sconf/202129001013 ◽

2021 ◽

Vol 290 ◽

pp. 01013

Author(s):

Dong Liang ◽

Fu Shen ◽

Zizhen Bao ◽

Yuchen Liu ◽

Honghui Li

Keyword(s):

Monte Carlo ◽

Nuclear Technology ◽

X Rays ◽

X Ray ◽

Textile Materials ◽

The Monte Carlo Method ◽

Technology Applications ◽

Lead Shielding ◽

Shielding Material ◽

Better Than

X-ray radioactive rays are widely used with the continuous development of radioactive medicine and nuclear technology applications, as well as lead shielding material pollutions new no lead shielding material was needed. In this paper, the main properties of metal tungsten and bismuth as X-ray shielding materials were studied for the protection people avoid the 150 kV X-rays by the Monte Carlo method is used to study. According to simulation with 2 kg/m2, results show that performance of single metal material tungsten iron is superior to that of bismuth material. Tungsten-bismuth better than bismuth-tungsten with the case of equal-quality double-layer metal. The protection performance is better when the metal-mixed tungsten-bismuth ratio is 0.5: 0.5 or the tungsten ratio is large. The research provides effective support for the development of textile radiation protection materials.

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Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927603440634 ◽

2003 ◽

Vol 9 (S02) ◽

pp. 32-33 ◽

Cited By ~ 3

Author(s):

Raynald Gauvin ◽

Eric Lifshin ◽

Hendrix Demers ◽

Paula Horny ◽

Helen Campbell

Keyword(s):

Monte Carlo ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Monte Carlo Program ◽

X Ray ◽

Scanning Electron

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A Monte Carlo calculation of the x-ray production from multilayer samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086970 ◽

1991 ◽

Vol 49 ◽

pp. 532-533

Author(s):

T. D. Ly ◽

D. G. Howitt

Keyword(s):

Monte Carlo ◽

Layered Structure ◽

Electron Microprobe ◽

Monte Carlo Calculation ◽

Monte Carlo Program ◽

Step Size ◽

Homogeneous Sample ◽

X Ray ◽

Microstructural Effects ◽

Signal Production

The X ray generation and absorption from a sample in an SEM or Electron Microprobe depends upon the geometry as well as the composition. Various schemes for calculating the X-ray signal from a homogeneous sample have been developed but few have addressed the problem associated with the presence of distinct microstructures. We have developed a Monte Carlo program to calculate the signal production from a multilayer sample as a first step to the incorporation of microstructural effects.The X-ray production from a layered structure is different from a homogeneous sample because the signal production and absorption are discontinuous. The differences can be calculated if the layer thicknesses and positions can be taken into account. The principle behind the calculation we have undertaken is the continuously monitor the energy and position of the electron in the specimen. Each trajectory is calculated in the usual stepwise manner except that the step size and scattering probability are continuously adjusted to accommodate the scale of the microstructure.

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