Elemental Mapping of Materials Using Omega Filter and Imaging Plate

2000 ◽  
Vol 6 (S2) ◽  
pp. 216-217
Author(s):  
Y. Ikematsu ◽  
D. Shindo ◽  
T. Oikawa ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Ccd Camera ◽  
Mapping Technique ◽  
Imaging Plate ◽  
Elemental Distribution ◽  
Elemental Mapping ◽  
Window Method ◽  
Transmission Electron ◽  
Window Technique ◽  
Imaging Plates

Elemental microanalysis has been important in materials characterization, since the elemental distribution strongly affects the property of various materials. A recently developed post-column energy filter coupled with a slow scan CCD camera makes it possible to carry out elemental mapping with a transmission electron microscope. Here, we develop the elemental mapping technique utilizing the omega filter and imaging plates (3760x3000 pixels). Since the data obtained from the imaging plates consist of a large number of pixels, fine and detailed elemental analysis will be expected.Energy-filtered images were obtained by a JEM-2010 electron microscope installed with an omega-type energy filter, and they were recorded on imaging plates (FDL-UR-V:25 μm/pixel). The width of an energy-selecting slit was set to be 20 eV. Elemental maps were obtained from the energy-filtered images using the three window technique. Special care was taken to reduce the image shifts among the three filtered images used in the three-window method.

Database of Electron Microscope Images on the World Wide Web

1997 ◽  
Vol 3 (S2) ◽  
pp. 1105-1106
Author(s):  
A. Taniyama ◽  
D. Shindo ◽  
K. Hiraga ◽  
T. Oikawa ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
World Wide ◽  
Computer Network ◽  
Ccd Camera ◽  
Digital Data ◽  
Imaging Plate ◽  
Network Systems ◽  
Transmission Electron ◽  
Microscope Images

Recently, new recording devices, such as the Imaging Plate and a slow scan CCD camera, have come into wide use for digitally recording and storing transmission electron microscope images. A digital image has advantages of transferring, sharing and storing data. Furthermore the improvement of world wide computer network systems, for example, Internet makes it easier to transfer and share digital data among researchers. We have studied the processing and a quantitative analysis of digital high-resolution transmission electron microscope (HREM) images by means of a standard EWS and an SX-3 super-computer on the intelligent computer network system in Tohoku University, which is called Super TAINS (Fig. 1). With the increase of digital HREM images, we are in need of tools to help us store and quickly search these data.A web site called “EMILIA (Electron Microscope Image Library and Archive)” was established in October 1996 as a database of HREM images. EMILIA is implemented by a WWW server on Super TAINS and HTML documents. Figure 2 shows sample pages from EMILIA.

Energy-filtered chemical mapping: Current applications to materials science

1994 ◽  
Vol 52 ◽  
pp. 958-959
Author(s):  
P. A. Crozier
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Materials Science ◽  
Ccd Camera ◽  
Image Plane ◽  
Scanning Transmission Electron Microscope ◽  
Thermal Source ◽  
Chemical Mapping ◽  
Elemental Mapping ◽  
Transmission Electron

Elemental mapping is a powerful technique for elucidating the distribution of elements on the nanometer scale in materials with complex morphologies. In electron microscopy, mapping is usually performed on a scanning transmission electron microscope (STEM) fitted with a field emission gun (FEG) using the techniques of energy-dispersive x-ray spectroscopy (EDX) or electron energy-loss spectroscopy (EELS). However, recent advances in spectrometer design and digital image recording have stimulated renewed interest in energy-filtered imaging and elemental mapping with a conventional transmission electron microscope. Here, some applications of energy-filtered chemical mapping in materials science are described.Experiments were conducted on a Zeiss 912 operating at 120 kV with a thermal source and equipped with an omega filter spectrometer. A variable width slit in the spectrometer image plane allows energy-filtered images to be formed on the microscope viewing screen. These images are digitally recorded using a Gatan 679 slow-scan CCD camera with 1024 pixels.

Image Restoration and Characteristics of Slow_Scan CCD Camera and Imaging Plates

1997 ◽  
Vol 3 (S2) ◽  
pp. 1091-1092
Author(s):  
J. M. Zuo
Keyword(s):  
Dynamic Range ◽  
Ccd Camera ◽  
Imaging Plate ◽  
Digital Recording ◽  
Pixel Size ◽  
Large Dynamic Range ◽  
Defect States ◽  
Transmission Electron ◽  
Electron Image ◽  
Imaging Plates

The performance of slow scan CCD (SSC) camera [1,2] and imaging plate (IP) [3] for digital recording is limited by resolution and noise. The SSC camera and IP are two digital detectors currently available for transmission electron microscope (TEM). Imaging plates are re-usable flexible sheets, which are used in the standard cassettes. They are readout digitally with a 25 μm pixel size. Both detectors are linear and have large dynamic range. The SSC is a fixed accessory of TEM, images can be acquired, processed and viewed immediately by the microscope operator. The IP fits into a regular film cassette and is used like film except for the processing method. The image plate records electron image by storing electron energy in the potential well of defect states in a photo-stimulable phosphor. The stored image is read out by scanning a laser probe and detecting the stimulated luminescence in a reader. The SSC uses scintillator to convert electrons to photons and detects photons with CCD through optical couplings. The IP has 3000X3760 pixels. The available SSC for electron microscopy ranges from 512×512 to 2048×2048 pixels.

Development of Line Analysis and Real-Time Elemental Mapping System in Stem Equipped with a Two-Window Energy Filter

2001 ◽  
Vol 7 (S2) ◽  
pp. 1134-1135
Author(s):  
K. Kaji ◽  
T. Aoyama ◽  
S. Taya ◽  
S. Isakozawa
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Elemental Mapping ◽  
Additional Function ◽  
Edge Structure ◽  
Transmission Electron ◽  
Mapping System ◽  
Scanning Transmission

The ability to obtain elemental maps processed by using inelastically scattered electrons in a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) is extremely useful in the analysis of materials, and semiconductor devices such as ULSI’s and GMR heads. Electron energy loss spectra (EELS) also give useful information not only to identify unknown materials but also to study chemical bonding states of the objective atoms. Hitachi developed an elemental mapping system, consisting of a STEM (Hitachi, HD- 2000) equipped with a two-window energy filter (Hitachi, ELV-2000), and performed realtime conventional jump-ratio images with nanometer resolution by in-situ calculation of energy-filtered signals [1]. Additional function of acquiring EELS along any lines on specimen has been developed in this system to investigate the energy loss near edge structure (ELNES).Figure 1 shows a schematic figure of the two-window energy filter, consisting of two quadrupole lenses for focusing and zooming spectra, respectively, a magnetic prism spectrometer, a deflection coil and two kinds of electron beam detectors.

An Interactive User Interface for Automated Acquisition of Transmission Electron Micrographs

2000 ◽  
Vol 6 (S2) ◽  
pp. 288-289
Author(s):  
J. Pulokas ◽  
N. Kisseberth ◽  
C.S. Potter ◽  
B. Carragher
Keyword(s):  
Electron Microscope ◽  
User Interface ◽  
Low Dose ◽  
Ccd Camera ◽  
Automated Control ◽  
Software Application ◽  
Transmission Electron ◽  
Set Up ◽  
Interactive User ◽  
Interactive User Interface

For several years we have been developing a software application, called Leginon, for the automated control and acquisition of images from a transmission electron microscope. The system has been developed around a Philips CM200 and a Gatan MSC CCD camera. One of the primary motivations in developing this software is to provide for a system that can acquire many hundreds of images under low dose conditions from a specimen embedded in vitreous ice. In order to set up and manage this system we have developed a number of simple interactive graphical tools that enable the user to design, oversee and manage protocols for controlling the microscope and collecting the images. Many of these simple tools have also proved generally useful as stand alone applications.

An Integrated Energy-Filtering TEM for The Life Sciences

1996 ◽  
Vol 54 ◽  
pp. 466-467
Author(s):  
A.F. de Jong ◽  
H. Coppoolse ◽  
U. Lücken ◽  
M.K. Kundmann ◽  
A.J. Gubbens ◽  
...  
Keyword(s):  
Low Dose ◽  
Life Sciences ◽  
Ccd Camera ◽  
Cold Trap ◽  
Objective Lens ◽  
Elemental Mapping ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Computer Controlled ◽  
High Degree

Energy-filtered transmission electron microscopy (EFTEM) has many uses in life sciences1. These include improved contrast for imaging unstained, cryo or thick samples; improved diffraction for electron crystallography, and elemental mapping and analysis. We have developed a new system for biological EFTEM that combines advanced electron-optical performance with a high degree of automation. The system is based on the Philips CM series of microscopes and the Gatan post-column imaging filter (GIF). One combination particulary suited for the life sciences is that of the CM 120-BioTWIN and the GIF100: the CM120-BioFilter. The CM 120-BioTWIN is equipped with a high-contrast objective lens for biological samples. Its specially designed cold-trap, together with low-dose software, supports full cryo-microscopy. The GIF 100 is corrected for second-order aberrations in both images and spectra. It produces images that are isochromatic to within 1.5 eV at 120 keV and distorted by less than 2% over lk x lk pixels. All the elements of the filter are computer controlled. Images and spectra are detected by a TV camera or a multi-scan CCD camera, both of which are incorporated in the filter. All filter and camera functions are controlled from Digital Micrograph running on an Apple Power Macintosh.

Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope

2012 ◽  
Vol 186 ◽  
pp. 53-57 ◽  
Author(s):  
Magdalena Bieda
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Quantitative Description ◽  
Ccd Camera ◽  
Microscopic Investigation ◽  
Automated System ◽  
Fine Grained ◽  
Transmission Electron ◽  
Orientation Maps ◽  
Diffraction Patterns

New subdivision of microscopic investigation called Orientation Microscopy (OM) is already well known in scanning electron microscope (SEM). Needs for investigation in nanoscale contribute to development of an appropriate method for transmission electron microscope (TEM). Automated acquisition and indexing of diffraction patterns, necessary for creation of orientation maps in TEM, cause more difficulties then in SEM. Nevertheless, the techniques of OM are also being developed in the Transmission Electron Microscope (TEM). Microdiffraction has been successfully introduced for creating such maps. Individual orientation measurements, which appeared in the convergent beam mode, can be used for quantitative description of microstructure of fine grained and deformed materials. The idea of the operation of the automated system in transmission electron microscope (TEM) which is developed in IMIM PAS relies on an automatic (with control position of the beam) acquisition of diffraction patterns using digital CCD camera, and indexing them, and then on the analysis of the set of individual crystallographic orientations. The graphic presentation of received sets of orientation can be analysed in order to obtain parameters and characteristics such as texture characteristics, characteristics of grain boundaries (based on orientation relationship) or the stereological characteristics. To illustrate application of this system, orientation maps measured in cold-rolled polycrystalline aluminium and its alloy 6013, and in multi-phase alloys of Fe-Cr-Co system after severe plastic deformation are presented.

Development of a Real-Time Elemental Mapping System in a Scanning Transmission Electron Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 178-179
Author(s):  
K. Kaji Ueda ◽  
T. Aoyama ◽  
S. Taya ◽  
H. Tanaka ◽  
S. Isakozawa
Keyword(s):  
Electron Microscope ◽  
Real Time ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Objective Lens ◽  
Elemental Mapping ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Mapping System ◽  
Scanning Transmission

The ability to obtain elemental maps in a transmission electron microscope (TEM) or scanning transmission electron microscope (STEM) is extremely useful in the analysis of materials, and semiconductor devices such as ULSI's and GMR heads. Hitachi has developed a new type of elemental mapping system, consisting of a STEM (Hitachi, HD-2000) equipped with a two-window electron energy filter. In-situ calculation of the energy-filtered signal makes it possible to observe real time elemental mapping images with nanometer resolution.Figure 1 shows a schematic of the elemental mapping system. In the STEM, electrons are generated from a cold field emission gun and accelerated to a potential of 200 kV. The electrons arc focused by the objective lens into a small probe (<1 nm), which is then rastered over the specimen using scanning coils. Transmitted electrons are collected by an energy filter, which is located beneath the specimen., and consists of quadrupole lenses, a magnetic prism spectrometer and two kinds of electron beam energy detectors.

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