scholarly journals Nanoscale Tuning of Grain Boundary Potential Barriers in Doped Strontium Titanate

2003 ◽  
Vol 9 (S02) ◽  
pp. 672-673
Author(s):  
Pradyumna L. Prabhumirashi ◽  
Andrew R. Lupini ◽  
Stephen J. Pennycook ◽  
Vinayak P. Dravid
1985 ◽  
Vol 60 ◽  
Author(s):  
L. C. Burton

AbstractElectronic current flow over grain boundary potential barriers for low resistance grains is first reviewed. It is then shown that if the resistance of the grains increases and/or grain size is reduced, the grains may be totally depleted of mobile charge. The grain boundary barrier is thus reduced to (D/2W)2 of its original large grain value, D being grain width and W the full space charge width. For high resistivity grains satisfying the relation D ≪ 2W, the conduction band becomes essentially flat. Phenomena formerly caused by grain boundary potential barriers (varistor and PTC effects seen in semiconducting ceramic) will be greatly reduced, or eliminated.Commercial COG and X7R MLC capacitors exhibit a transition from super-ohmic to ohmic behavior at high voltages, paralleling the behavior of the varistor. Two possible mechanisms that could account for this are varistor-like grain boundary behavior, or space charge limited diffusion current.


2001 ◽  
Vol 664 ◽  
Author(s):  
Toshio Kamiya ◽  
Yong T. Tan ◽  
Yoshikazu Furuta ◽  
Hiroshi Mizuta ◽  
Zahid A.K. Durrania ◽  
...  

ABSTRACTCarrier transport was investigated in two different types of ultra-thin silicon films, polycrystalline silicon (poly-Si) films with large grains > 20 nm in size and hydrogenated nanocrystalline silicon (nc-Si:H) films with grains 4 nm – 8 nm in size. It was found that there were local non-uniformities in grain boundary potential barriers in both types of films. Single-electron charging effects were observed in 30 nm × 30 nm nanowires fabricated in 30 nm-thick nc-Si:H films, where the electrons were confined in crystalline silicon grains encapsulated by amorphous silicon. In contrast, the poly-Si nanowires of similar dimensions showed thermionic emission over the grain boundary potential barriers formed by carrier trapping in grain boundary defects.


2020 ◽  
Vol 53 (2) ◽  
pp. 349-359 ◽  
Author(s):  
A. Trenkle ◽  
M. Syha ◽  
W. Rheinheimer ◽  
P.G. Callahan ◽  
L. Nguyen ◽  
...  

Nondestructive X-ray diffraction contrast tomography imaging was used to characterize the microstructure evolution in a polycrystalline bulk strontium titanate specimen. Simultaneous acquisition of diffraction and absorption information allows for the reconstruction of shape and orientation of more than 800 grains in the specimen as well as porosity. Three-dimensional microstructure reconstructions of two coarsening states of the same specimen are presented alongside a detailed exploration of the crystallographic, topological and morphological characteristics of the evolving microstructure. The overall analysis of the 3D structure shows a clear signature of the grain boundary anisotropy, which can be correlated to surface energy anisotropy: the grain boundary plane distribution function shows an excess of 〈100〉-oriented interfaces with respect to a random structure. The results are discussed in the context of interface property anisotropy effects.


InfoMat ◽  
2019 ◽  
Vol 2 (2) ◽  
pp. 409-423 ◽  
Author(s):  
Behzad Bahrami ◽  
Sally Mabrouk ◽  
Nirmal Adhikari ◽  
Hytham Elbohy ◽  
Ashim Gurung ◽  
...  

1990 ◽  
Vol 67 (4) ◽  
pp. 2088-2092 ◽  
Author(s):  
J. Illingsworth ◽  
H. M. Al‐Allak ◽  
A. W. Brinkman ◽  
J. Woods

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