Spatial Distribution Maps for Atom Probe Tomography

2007 ◽  
Vol 13 (6) ◽  
pp. 437-447 ◽  
Author(s):  
Brian P. Geiser ◽  
Thomas F. Kelly ◽  
David J. Larson ◽  
Jason Schneir ◽  
Jay P. Roberts
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Detection Efficiency ◽  
Structural Information ◽  
Atom Probe ◽  
Dark Field ◽  
Distribution Functions ◽  
Orientation Relationships ◽  
Distribution Maps ◽  
Space Technique

A real-space technique for finding structural information in atom probe tomographs, spatial distribution maps (SDM), is described. The mechanics of the technique are explained, and it is then applied to some test cases. Many applications of SDM in atom probe tomography are illustrated with examples including finding crystal lattices, correcting lattice strains in reconstructed images, quantifying trajectory aberrations, quantifying spatial resolution, quantifying chemical ordering, dark-field imaging, determining orientation relationships, extracting radial distribution functions, and measuring ion detection efficiency.

Refining Spatial Distribution Maps for Atom Probe Tomography via Data Dimensionality Reduction Methods

2012 ◽  
Vol 18 (5) ◽  
pp. 941-952 ◽  
Author(s):  
Santosh K. Suram ◽  
Krishna Rajan
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Structural Information ◽  
Three Dimensional ◽  
Relevant Information ◽  
Atom Probe ◽  
Mathematical Framework ◽  
Frequency Distributions ◽  
Distribution Maps ◽  
Singular Vectors

AbstractA mathematical framework based on singular value decomposition is used to analyze the covariance among interatomic frequency distributions in spatial distribution maps (SDMs). Using this approach, singular vectors that capture the covariance within the SDM data are obtained. The structurally relevant singular vectors (SRSVs) are identified. Using the SRSVs, we extract information from z-SDMs that not only captures the offset between the atomic planes but also captures the covariance in the atomic structure among the neighborhood atomic planes. These refined z-SDMs classify the Δ(Δz) slices in the SDMs into structurally relevant information, noise, and aberrations. The SRSVs are used to construct refined xy-SDMs that provide enhanced structural information for three-dimensional atom probe tomography.

Informatics for Quantitative Analysis of Atom Probe Tomography Images

2009 ◽  
Vol 1231 ◽  
Author(s):  
Santosh K Suram ◽  
Krishna Rajan
Keyword(s):  
Data Mining ◽  
Spatial Distribution ◽  
Quantitative Analysis ◽  
Atom Probe Tomography ◽  
Structural Information ◽  
Three Dimensional ◽  
Atomic Plane ◽  
Atom Probe ◽  
Distribution Maps

AbstractAn informatics based approach to extract further refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) has been developed. The data mining based methods to generate and interpret spectra that de-convolute the SDMs are discussed. This work has resulted in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies is also discussed.

Spatial Distribution Maps for Atom Probe Tomography

2006 ◽  
Author(s):  
B. P. Geiser ◽  
J. Schneir ◽  
J. Roberts ◽  
S. Wiener ◽  
D. J. Larson ◽  
...  
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Distribution Maps

Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

2018 ◽  
Vol 153 ◽  
pp. 109-113
Author(s):  
Georges Beainy ◽  
Reynald Alcotte ◽  
Franck Bassani ◽  
Mickaël Martin ◽  
Adeline Grenier ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Direct Examination

scholarly journals Measurement of Detection Efficiency in Atom Probe Tomography

2014 ◽  
Vol 20 (S3) ◽  
pp. 1160-1161
Author(s):  
T.J. Prosa ◽  
B.P. Geiser ◽  
R.M. Ulfig ◽  
T.F. Kelly ◽  
D.J. Larson
Keyword(s):  
Atom Probe Tomography ◽  
Detection Efficiency ◽  
Atom Probe

Spatial distribution of substitutional Mn-As clusters in ferromagnetic (Zn,Sn,Mn)As2 thin films revealed by image reconstruction of atom probe tomography data

2019 ◽  
Vol 125 (7) ◽  
pp. 073902 ◽  
Author(s):  
Hiroto Oomae ◽  
Miyuki Shinoda ◽  
Joel T. Asubar ◽  
Kai Sato ◽  
Hideyuki Toyota ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Distribution ◽  
Image Reconstruction ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Tomography Data

scholarly journals Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

2016 ◽  
Vol 22 (S3) ◽  
pp. 702-703 ◽  
Author(s):  
D. Isheim ◽  
J. Coakley ◽  
A. Radecka ◽  
D. Dye ◽  
T.J. Prosa ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Detection Efficiency ◽  
Atom Probe ◽  
Nanometer Scale

scholarly journals Evaluation of Detection Efficiency of Atom Probe Tomography

2014 ◽  
Vol 20 (3) ◽  
pp. 177-181
Author(s):  
Masato Morita ◽  
Masanobu Karasawa ◽  
Takahiro Asaka ◽  
Masanori Owari
Keyword(s):  
Atom Probe Tomography ◽  
Detection Efficiency ◽  
Atom Probe

Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs

2019 ◽  
Vol 25 (2) ◽  
pp. 301-308 ◽  
Author(s):  
Isabelle Mouton ◽  
Shyam Katnagallu ◽  
Surendra Kumar Makineni ◽  
Oana Cojocaru-Mirédin ◽  
Torsten Schwarz ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Elemental Analysis ◽  
Atom Probe Tomography ◽  
Point Cloud ◽  
Cross Correlation ◽  
Structural Information ◽  
Atom Probe ◽  
Accurate Estimation ◽  
Spatial Scaling ◽  
Relative Ease

AbstractAlthough atom probe tomography (APT) reconstructions do not directly influence the local elemental analysis, any structural inferences from APT volumes demand a reliable reconstruction of the point cloud. Accurate estimation of the reconstruction parameters is crucial to obtain reliable spatial scaling. In the current work, a new automated approach of calibrating atom probe reconstructions is developed using only one correlative projection electron microscopy (EM) image. We employed an algorithm that implements a 2D cross-correlation of microstructural features observed in both the APT reconstructions and the corresponding EM image. We apply this protocol to calibrate reconstructions in a Cu(In,Ga)Se2-based semiconductor and in a Co-based superalloy. This work enables us to couple chemical precision to structural information with relative ease.

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