A polarized light field microscope with fast polarization switcher and microlens array reveals the 3-D birefringence distribution of complex anisotropic structures

2008 ◽  
Vol 14 (S2) ◽  
pp. 742-743
Author(s):  
R Oldenbourg

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

2018 ◽  
Vol 26 (4) ◽  
pp. 4035 ◽  
Author(s):  
Zhaowei Xin ◽  
Dong Wei ◽  
Xingwang Xie ◽  
Mingce Chen ◽  
Xinyu Zhang ◽  
...  

Author(s):  
Rudolf Oldenbourg

The polarized light microscope has the unique potential to measure submicroscopic molecular arrangements dynamically and non-destructively in living cells and other specimens. With the traditional pol-scope, however, single images display only those anisotropic structures that have a limited range of orientations with respect to the polarization axes of the microscope. Furthermore, rapid measurements are restricted to a single image point or single area that exhibits uniform birefringence or other form of optical anisotropy, while measurements comparing several image points take an inordinately long time.We are developing a new kind of polarized light microscope which combines speed and high resolution in its measurement of the specimen anisotropy, irrespective of its orientation. The design of the new pol-scope is based on the traditional polarized light microscope with two essential modifications: circular polarizers replace linear polarizers and two electro-optical modulators replace the traditional compensator. A video camera and computer assisted image analysis provide measurements of specimen anisotropy in rapid succession for all points of the image comprising the field of view.


2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Wanrong Gao

AbstractIn this work, we introduce the concept of anisotropic dielectric susceptibility matrix of anisotropic medium for both nondepolarizing and depolarizing medium. The concept provides a new way of analyzing light scattering properties of anisotropic media illuminated by polarized light. The explicit expressions for the elements of the scattering matrix are given in terms of the elements of the Fourier transform of the anisotropic dielectric susceptibility matrix of the medium. Finally, expressions for the elements of the Jones matrix of a thin layer of a deterministic anisotropic medium and the elements of the Mueller matrix of a depolarizing medium are given. The results obtained in this work is helpful for deriving information about the correlated anisotropic structures in depolarizing media from measured Mueller matrices. The findings in this work may also well prove stimulating to researchers working on new methods for analyzing light scattering properties.


1998 ◽  
Vol 44 (1) ◽  
pp. 20-24 ◽  
Author(s):  
G Nienhuis ◽  
A. V Taichenachev ◽  
A. M Tumaikin ◽  
V. I Yudin

2010 ◽  
Vol 39 (1) ◽  
pp. 123-126 ◽  
Author(s):  
袁艳 YUAN Yan ◽  
周宇 ZHOU Yu ◽  
胡煌华 HU Huang-hua

2020 ◽  
Vol 6 ◽  
pp. 591-603
Author(s):  
Maximilian Schambach ◽  
Fernando Puente Puente Leon
Keyword(s):  

2019 ◽  
Vol 45 (1) ◽  
pp. 228 ◽  
Author(s):  
Zong Qin ◽  
Jui-Yi Wu ◽  
Ping-Yen Chou ◽  
Yu-Ting Chen ◽  
Cheng-Ting Huang ◽  
...  
Keyword(s):  

2008 ◽  
Vol 14 (S2) ◽  
pp. 1032-1033 ◽  
Author(s):  
S Sparenga

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


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