scholarly journals Nanometer Scale Tomographic Investigation of Fine Scale Precipitates in a CuFeNi Granular System by Three-Dimensional Field Ion Microscopy

2012 ◽  
Vol 18 (5) ◽  
pp. 1129-1134 ◽  
Author(s):  
Sophie Cazottes ◽  
François Vurpillot ◽  
Abdeslem Fnidiki ◽  
Dany Lemarchand ◽  
Marcello Baricco ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Precise Determination ◽  
Atomic Scale ◽  
Granular System ◽  
Field Ion Microscopy ◽  
Mean Diameter ◽  
The Matrix ◽  
The Mean ◽  
Ion Microscopy

AbstractThe microstructure of Cu80Fe10Ni10 (at. %) granular ribbons was investigated by means of three-dimensional field ion microscopy (3D FIM). This ribbon is composed of magnetic precipitates embedded in a nonmagnetic matrix. The magnetic precipitates have a diameter smaller than 5 nm in the as-spun state and are coherent with the matrix. No accurate characterization of such a microstructure has been performed so far. A tomographic characterization of the microstructure of melt spun and annealed Cu80Fe10Ni10 ribbon was achieved with 3D FIM at the atomic scale. A precise determination of the size distribution, number density, and distance between the precipitates was carried out. The mean diameter for the precipitates is 4 nm in the as-spun state. After 2 h at 350°C, there is an increase of the size of the precipitates, while after 2 h at 400°C the mean diameter of the precipitates decreases. Those data were used as inputs in models that describe the magnetic and magnetoresistive properties of this alloy.

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

2017 ◽  
Vol 23 (2) ◽  
pp. 210-220 ◽  
Author(s):  
Francois Vurpillot ◽  
Frédéric Danoix ◽  
Matthieu Gilbert ◽  
Sebastian Koelling ◽  
Michal Dagan ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Image Sequences ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Physical Metallurgy ◽  
Science And Engineering ◽  
Computing Power ◽  
Field Ion Microscopy ◽  
Ion Microscopy

AbstractThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale three-dimensional images of materials. This capability is not new, as the first atomic-scale reconstructions of features utilizing FIM were demonstrated decades ago. The rise of atom probe tomography, and the application of this latter technique in place of FIM has unfortunately severely limited further FIM development. Currently, the ubiquitous availability of extensive computing power makes it possible to treat and reconstruct FIM data digitally and this development allows the image sequences obtained utilizing FIM to be extremely valuable for many material science and engineering applications. This article demonstrates different applications of these capabilities, focusing on its use in physical metallurgy and semiconductor science and technology.

Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

2021 ◽  
pp. 1-9
Author(s):  
Benjamin Klaes ◽  
Jeoffrey Renaux ◽  
Rodrigue Lardé ◽  
Fabien Delaroche ◽  
Felipe F. Morgado ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Annealed Sample ◽  
Atomic Scale ◽  
Crystalline Materials ◽  
Field Ion Microscopy ◽  
Amorphous Glass ◽  
Ion Microscopy ◽  
The Moment ◽  
Microscopy Techniques

Three-dimensional field ion microscopy is a powerful technique to analyze material at a truly atomic scale. Most previous studies have been made on pure, crystalline materials such as tungsten or iron. In this article, we study more complex materials, and we present the first images of an amorphous sample, showing the capability to visualize the compositional fluctuations compatible with theoretical medium order in a metallic glass (FeBSi), which is extremely challenging to observe directly using other microscopy techniques. The intensity of the spots of the atoms at the moment of field evaporation in a field ion micrograph can be used as a proxy for identifying the elemental identity of the imaged atoms. By exploiting the elemental identification and positioning information from field ion images, we show the capability of this technique to provide imaging of recrystallized phases in the annealed sample with a superior spatial resolution compared with atom probe tomography.

Macro- to Atomic-Scale Tailoring of Si3N4 Ceramics to Enhance Properties

2005 ◽  
Vol 287 ◽  
pp. 233-241 ◽  
Author(s):  
Paul F. Becher ◽  
Gayle S. Painter ◽  
Naoya Shibata ◽  
Hua Tay Lin ◽  
Mattison K. Ferber
Keyword(s):  
Electronic Device ◽  
Atomic Level ◽  
Atomic Scale ◽  
Fracture Properties ◽  
Beta Particles ◽  
Preferential Segregation ◽  
Nitride Ceramics ◽  
Theoretical Predictions ◽  
The Matrix

Silicon nitride ceramics are finding uses in numerous engineering applications because of their tendency to form whisker-like microstructures that can overcome the inherent brittle nature of ceramics. Studies now establish the underlying microscopic and atomic-scale principles for engineering a tough, strong ceramic. The theoretical predictions are confirmed by macroscopic observations and atomic level characterization of preferential segregation at the interfaces between the grains and the continuous nanometer thick amorphous intergranular film (IGF). Two interrelated factors must be controlled for this to occur including the generation of the elongated reinforcing grains during sintering and debonding of the interfaces between the reinforcing grains and the matrix. The reinforcing grains can be controlled by (1) seeding with beta particles and (2) the chemistry of the additives, which also can influence the interfacial debonding conditions. In addition to modifying the morphology of the reinforcing grains, it now appears that the combination of preferential segregation and strong bonding of the additives (e.g., the rare earths, RE) to the prism planes can also result in sufficiently weakens the bond of the interface with the IGF to promote debonding. Thus atomic-scale engineering may allow us to gain further enhancements in fracture properties. This new knowledge will enable true atomic-level engineering to be joined with microscale tailoring to develop the advanced ceramics that will be required for more efficient engines, new electronic device architectures and composites.

Observation of Growth Front on the Initial Stage of Goss Abnormally-Growing Grain in Fe-3%Si Steel

2013 ◽  
Vol 753 ◽  
pp. 307-310
Author(s):  
Kyung Jun Ko ◽  
Jong Tae Park ◽  
Chan Hee Han
Keyword(s):  
Solid State ◽  
Grain Boundary ◽  
Three Dimensional ◽  
Secondary Recrystallization ◽  
Growth Front ◽  
Very High Frequency ◽  
Grain Boundary Mobility ◽  
Initial Stage ◽  
The Matrix

During abnormal grain growth, a few Goss grains grow exclusively fast and consume the matrix grains. The Goss abnormally-growing grain (AGG) has peculiar features which are irregular grain boundaries and very high frequency of peninsular grains nearby the growth front of AGG and island grains trapped inside AGG. These features might provide a clue for clarifying the mechanism of Goss AGG. The experimentally-observed microstructural feature and grain boundary characterization of Goss were approached by the solid-state wetting mechanism. In this study, observing the three-dimensional wetting morphology in serial section images of Goss AGG by EBSD, we report some direct microstrucrual evidence supporting solid-state wetting mechanism for Goss AGG. The solid-state wetting mechanism for the evolution of the Goss AGG in Fe-3%Si steel explains the microstructural features evolved during secondary recrystallization, which cannot be approached by the conventional theories based on the grain boundary mobility.

scholarly journals Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

2017 ◽  
Vol 23 (2) ◽  
pp. 255-268 ◽  
Author(s):  
Michal Dagan ◽  
Baptiste Gault ◽  
George D. W. Smith ◽  
Paul A. J. Bagot ◽  
Michael P. Moody
Keyword(s):  
Three Dimensional ◽  
Reconstruction Algorithm ◽  
Automated Analysis ◽  
Atom Probe ◽  
Crystal Defects ◽  
Steel Matrix ◽  
Field Evaporation ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Microscopy Data

AbstractAn automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen’s surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM’s potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of “out of sequence” events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.

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