scholarly journals Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector

2015 ◽  
Vol 21 (S3) ◽  
pp. 1867-1868 ◽  
Author(s):  
Jason Holm ◽  
Robert Keller
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Detector ◽  
Transmission Scanning Electron Microscopy ◽  
Scanning Electron

Diffraction Patterns Obtained by Scanning Electron Microscope

1972 ◽  
Vol 27 (3) ◽  
pp. 441-444d ◽  
Author(s):  
F Fujimoto ◽  
K Komaki ◽  
S Takagi ◽  
H Koike
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Incident Beam ◽  
Reciprocal Theorem ◽  
Diffraction Patterns ◽  
The Reciprocal Theorem ◽  
Convergent Beam ◽  
Beam Technique ◽  
Transmission Scanning Electron Microscopy ◽  
Scanning Electron

AbstractKossel-Möllenstedt and Kikuchi patterns are obtained by transmission scanning electron microscopy and compared with those obtained by the convergent beam technique from the same portion of the specimen. The identity of corresponding patterns obtained by both techniques shows the validity of the reciprocal theorem in electron diffraction for both elastic and inelastic scattering. The variations of Kossel-Möllenstedt patterns with the conditions of the incident beam and the position of the detector are also shown.

scholarly journals Defect Characterization using Transmission Scanning Electron Microscopy

2018 ◽  
Vol 24 (S1) ◽  
pp. 1836-1837 ◽  
Author(s):  
Patrick Callahan ◽  
Jean-Charles Stinville ◽  
Eric Yao ◽  
McLean P. Echlin ◽  
Jungho Shin ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Defect Characterization ◽  
Transmission Scanning Electron Microscopy ◽  
Scanning Electron

Transmission scanning electron microscopy: Defect observations and image simulations

2018 ◽  
Vol 186 ◽  
pp. 49-61 ◽  
Author(s):  
Patrick G. Callahan ◽  
Jean-Charles Stinville ◽  
Eric R. Yao ◽  
McLean P. Echlin ◽  
Michael S. Titus ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Image Simulations ◽  
Transmission Scanning Electron Microscopy ◽  
Scanning Electron
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