ToF-SIMS Investigations of Tip-Surface Chemical Interactions in Atomic Force Microscopy on a Combined AFM/ToF-SIMS Platform

Microscopy and Microanalysis ◽

10.1017/s1431927617011072 ◽

2017 ◽

Vol 23 (S1) ◽

pp. 2082-2083

Author(s):

Chance C. Brown ◽

Anton V. Ievlev ◽

Petro Maksymovych ◽

Sergei V. Kalinin ◽

Olga S. Ovchinnikova

Keyword(s):

Atomic Force Microscopy ◽

Surface Chemical ◽

Chemical Interactions ◽

Force Microscopy ◽

Atomic Force ◽

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Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

10.3403/30203231u ◽

2015 ◽

Keyword(s):

Atomic Force Microscopy ◽

Chemical Analysis ◽

Surface Chemical ◽

In Situ Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Afm Probe ◽

Surface Chemical Analysis

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Surface chemical investigation and topography study of hydrogen baked Si surfaces by infrared spectroscopy and Atomic Force Microscopy

Control of Semiconductor Interfaces ◽

10.1016/b978-0-444-81889-8.50063-8 ◽

1994 ◽

pp. 339-345

Author(s):

S. Verhaverbeke ◽

H. Bender ◽

O. Vatel ◽

M. Caymax ◽

J. Alay ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Infrared Spectroscopy ◽

Chemical Investigation ◽

Surface Chemical ◽

Force Microscopy ◽

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Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol

Data in Brief ◽

10.1016/j.dib.2016.07.052 ◽

2016 ◽

Vol 8 ◽

pp. 1322-1332

Author(s):

J. Bobrowska ◽

J. Pabijan ◽

J. Wiltowska-Zuber ◽

B.R. Jany ◽

F. Krok ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Sample Preparation ◽

Melanoma Cells ◽

Force Microscopy ◽

Atomic Force ◽

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Organometallic Bonding in an Ullmann-Type On-Surface Chemical Reaction Studied by High-Resolution Atomic Force Microscopy

Small ◽

10.1002/smll.201601216 ◽

2016 ◽

Vol 12 (38) ◽

pp. 5303-5311 ◽

Author(s):

Shigeki Kawai ◽

Ali Sadeghi ◽

Toshihiro Okamoto ◽

Chikahiko Mitsui ◽

Rémy Pawlak ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Chemical Reaction ◽

Surface Chemical ◽

Surface Chemical Reaction ◽

Force Microscopy ◽

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Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of theα−Sn∕Si(111)−(3×3)R30°surface

Physical Review B ◽

10.1103/physrevb.73.205329 ◽

2006 ◽

Vol 73 (20) ◽

Author(s):

Yoshiaki Sugimoto ◽

Pablo Pou ◽

Óscar Custance ◽

Pavel Jelinek ◽

Seizo Morita ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Short Range ◽

Chemical Interactions ◽

Force Microscopy ◽

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Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199907)27:7<659::aid-sia557>3.0.co;2-g ◽

1999 ◽

Vol 27 (7) ◽

pp. 659-669 ◽

Author(s):

Keyang Xu ◽

Arkady I. Gusev ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

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Resolving the internal structure of individual atmospheric aerosol particle by the combination of Atomic Force Microscopy, ESEM–EDX, Raman and ToF–SIMS imaging

Microchemical Journal ◽

10.1016/j.microc.2013.12.007 ◽

2014 ◽

Vol 114 ◽

pp. 89-98 ◽

Author(s):

S. Sobanska ◽

G. Falgayrac ◽

J. Rimetz-Planchon ◽

E. Perdrix ◽

C. Brémard ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Internal Structure ◽

Aerosol Particle ◽

Atmospheric Aerosol ◽

Force Microscopy ◽

Atomic Force ◽

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Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

10.3403/30203231 ◽

2014 ◽

Keyword(s):

Atomic Force Microscopy ◽

Chemical Analysis ◽

Surface Chemical ◽

In Situ Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Afm Probe ◽

Surface Chemical Analysis

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Atomic force microscopy as a tool to correlate nanostructure to properties of glasses

Journal of Non-Crystalline Solids ◽

10.1016/s0022-3093(97)00352-9 ◽

1997 ◽

Vol 222 (1-2) ◽

pp. 69-82 ◽

Author(s):

E Rädlein

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

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Localized electrochemical impedance measurements on nafion membranes: Observation and analysis of spatially diverse proton transport using atomic force microscopy

10.1021/scimeetings.0c01147 ◽

2020 ◽

Author(s):

xiaojiang wang

Keyword(s):

Atomic Force Microscopy ◽

Proton Transport ◽

Electrochemical Impedance ◽

Impedance Measurements ◽

Force Microscopy ◽

Atomic Force ◽

Nafion Membranes

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