Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry

Helium Ion ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Characterization Of Materials ◽

Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Microscopy and Microanalysis ◽

10.1017/s1431927619005075 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 868-869

Author(s):

Artem A. Trofimov ◽

Matthias Lorenz ◽

Anton Ievlev ◽

Stephen T. King ◽

Olga S. Ovchinnikova ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Helium Ion ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT. ◽

Characterization of materials critical to high-speed silicon devices using secondary ion mass spectrometry

10.1109/iwjt.2002.1225197 ◽

2002 ◽

Author(s):

C.W. Magee

Keyword(s):

Mass Spectrometry ◽

High Speed ◽

Silicon Devices ◽

Ion Mass Spectrometry ◽

Characterization Of Materials ◽

Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/acs.analchem.8b02530 ◽

2018 ◽

Vol 90 (20) ◽

pp. 11989-11995 ◽

Cited By ~ 3

Author(s):

Florian Vollnhals ◽

Tom Wirtz

Keyword(s):

Mass Spectrometry ◽

Correlative Microscopy ◽

Helium Ion ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for High-Resolution Nano-Analytics in Life Sciences

Microscopy and Microanalysis ◽

10.1017/s1431927619005865 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 1026-1027 ◽

Cited By ~ 2

Author(s):

Jelena Lovric ◽

Jean-Nicolas Audinot ◽

Tom Wirtz

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Life Sciences ◽

Helium Ion ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

ACS Applied Energy Materials ◽

10.1021/acsaem.0c01333 ◽

2020 ◽

Vol 3 (9) ◽

pp. 8822-8832

Author(s):

Laura Wheatcroft ◽

Nico Klingner ◽

René Heller ◽

Gregor Hlawacek ◽

Doğan Özkaya ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Chemical Characterization ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Helium Ion Microscopy with Secondary Ion Mass Spectrometry for Nanoscale Chemical Imaging and Analysis of Polyolefins

ACS Applied Polymer Materials ◽

10.1021/acsapm.1c00407 ◽

2021 ◽

Author(s):

Olga S. Ovchinnikova ◽

Nikolay Borodinov ◽

Artem A. Trofimov ◽

Steven T. King ◽

Matthias Lorenz ◽

...

Keyword(s):

Mass Spectrometry ◽

Chemical Imaging ◽

Helium Ion ◽

Ion Mass Spectrometry ◽

Nanoscale Chemical Imaging ◽

Ion Microscopy ◽

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Secondary ion mass spectrometry (SIMS) applications on characterization of RF NPN bipolar polysilicon emitter process

10.1063/1.52570 ◽

1997 ◽

Cited By ~ 2

Author(s):

S. Lu

Keyword(s):

Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Polysilicon Emitter ◽

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽