scholarly journals Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals

2019 ◽  
Vol 25 (S2) ◽  
pp. 1402-1403 ◽  
Author(s):  
Daliang Zhang ◽  
Nini Wei ◽  
Lingmei Liu ◽  
Kepeng Song ◽  
Ali Behzad ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

3D electron microscopy investigations of human dentin at the micro/nano-scale using focused ion beam based nanostructuring

RSC Advances ◽  
2015 ◽  
Vol 5 (10) ◽  
pp. 7196-7199 ◽  
Author(s):  
Meltem Sezen ◽  
Sina Sadighikia
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Resolution Electron Microscopy ◽  
High Definition ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Human Dentin ◽  
Microscopy Techniques

In this study, high resolution electron microscopy techniques, such as Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM) and High Resolution Transmission Electron Microscopy (HRTEM) allowed for revealing micro/nano features within human dentin with high definition and accuracy.

Some applications of ion beam sputtering to high resolution electron microscopy

Micron (1969) ◽  
1977 ◽  
Vol 8 (3) ◽  
pp. 151-170 ◽  
Author(s):  
K. Hojou ◽  
T. Oikawa ◽  
K. Kanaya ◽  
T. Kimura ◽  
K. Adachi
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Ion Beam ◽  
High Resolution Electron Microscopy ◽  
Ion Beam Sputtering ◽  
Resolution Electron ◽  
Beam Sputtering
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