scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

scholarly journals High-Resolution Imaging with Atomic Force Microscopy

2004 ◽  
Vol 12 (5) ◽  
pp. 12-15
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Detection Scheme ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

Adsorption and Desorption of AlCl3on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy

1993 ◽  
Vol 32 (Part 1, No. 12B) ◽  
pp. 6200-9202 ◽  
Author(s):  
Katsuhiro Uesugi ◽  
Takaharu Takiguchi ◽  
Michiyoshi Izawa ◽  
Masamichi Yoshimura ◽  
Takafumi Yao
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Adsorption And Desorption ◽  
Force Microscopy ◽  
Atomic Force
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