Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments

1985 ◽  
Vol 57 (12) ◽  
pp. 2384-2388 ◽  
Author(s):  
Ioannis V. Bletsos ◽  
David M. Hercules ◽  
Dieter. Greifendorf ◽  
Alfred. Benninghoven
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

High mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignments

1989 ◽  
Vol 14 (3) ◽  
pp. 135-142 ◽  
Author(s):  
E. Niehuis ◽  
P. N. T. Van Velzen ◽  
J. Lub ◽  
T. Heller ◽  
A. Benninghoven
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Mass Resolution ◽  
High Mass ◽  
Resolution Time ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Mass Spectrometry Application

Topography Measurements Using High Mass Resolution Time-of-Flight Secondary Ion Mass Spectrometry: Application to Banknotes

2019 ◽  
Vol 91 (14) ◽  
pp. 8864-8872 ◽  
Author(s):  
Alice Bejjani ◽  
Manale Noun ◽  
Serge Della-Negra ◽  
Raymond Tannous ◽  
Georges Chalhoub ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Mass Resolution ◽  
High Mass ◽  
Resolution Time ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Mass Spectrometry Application

scholarly journals Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

2015 ◽  
Vol 29 (13) ◽  
pp. 1187-1195 ◽  
Author(s):  
Quentin P. Vanbellingen ◽  
Nicolas Elie ◽  
Michael J. Eller ◽  
Serge Della‐Negra ◽  
David Touboul ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Biological Samples ◽  
Mass Spectrometry Imaging ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Delayed Extraction ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Optics-Free Visualization of Proteins in Single Cells by Time of Flight-Secondary Ion Mass Spectrometry Coupled with Genetically Encoded Chemical Tags

2020 ◽  
Author(s):  
Feifei Jia ◽  
Jie Wang ◽  
Yanyan Zhang ◽  
Qun Luo ◽  
Luyu Qi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Single Cells ◽  
Time Of Flight ◽  
E Coli ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Chemical Tags ◽  
Secondary Ion

<p></p><p><i>In situ</i> visualization of proteins of interest at single cell level is attractive in cell biology, molecular biology and biomedicine, which usually involves photon, electron or X-ray based imaging methods. Herein, we report an optics-free strategy that images a specific protein in single cells by time of flight-secondary ion mass spectrometry (ToF-SIMS) following genetic incorporation of fluorine-containing unnatural amino acids as a chemical tag into the protein via genetic code expansion technique. The method was developed and validated by imaging GFP in E. coli and human HeLa cancer cells, and then utilized to visualize the distribution of chemotaxis protein CheA in E. coli cells and the interaction between high mobility group box 1 protein and cisplatin damaged DNA in HeLa cells. The present work highlights the power of ToF-SIMS imaging combined with genetically encoded chemical tags for <i>in situ </i>visualization of proteins of interest as well as the interactions between proteins and drugs or drug damaged DNA in single cells.</p><p></p>

Visualizing mass transport in desorption electrospray ionization using time-of-flight secondary ion mass spectrometry: a look at the geometric configuration of the spray

The Analyst ◽  
2014 ◽  
Vol 139 (22) ◽  
pp. 5868-5878 ◽  
Author(s):  
Shin Muramoto
Keyword(s):  
Mass Spectrometry ◽  
Mass Transport ◽  
Electrospray Ionization ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Desorption Electrospray Ionization ◽  
Geometric Configuration ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

The desorption profile of analyte molecules desorbed by desorption electrospray ionization was imaged and characterized using time-of-flight secondary ion mass spectrometry.

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

2021 ◽  
Vol 13 (34) ◽  
pp. 41262-41274
Author(s):  
Agnieszka Priebe ◽  
Jordi Sastre ◽  
Moritz H. Futscher ◽  
Jakub Jurczyk ◽  
Marcos V. Puydinger dos Santos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization
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