Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

2008 ◽  
Vol 80 (9) ◽  
pp. 3261-3269 ◽  
Author(s):  
Robyn E. Goacher ◽  
Hong Luo ◽  
Joseph A. Gardella
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Compound Semiconductors ◽  
Cluster Ions ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

High mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignments

1989 ◽  
Vol 14 (3) ◽  
pp. 135-142 ◽  
Author(s):  
E. Niehuis ◽  
P. N. T. Van Velzen ◽  
J. Lub ◽  
T. Heller ◽  
A. Benninghoven
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Mass Resolution ◽  
High Mass ◽  
Resolution Time ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Mass Spectrometry Application

Analysis of bone minerals by time-of-flight secondary ion mass spectrometry: a comparative study using monoatomic and cluster ions sources

2007 ◽  
Vol 21 (5) ◽  
pp. 745-749 ◽  
Author(s):  
Per Malmberg ◽  
Ulf Bexell ◽  
Cecilia Eriksson ◽  
Håkan Nygren ◽  
Katrin Richter
Keyword(s):  
Mass Spectrometry ◽  
Comparative Study ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Cluster Ions ◽  
Ion Mass Spectrometry ◽  
Bone Minerals ◽  
Secondary Ion

Topography Measurements Using High Mass Resolution Time-of-Flight Secondary Ion Mass Spectrometry: Application to Banknotes

2019 ◽  
Vol 91 (14) ◽  
pp. 8864-8872 ◽  
Author(s):  
Alice Bejjani ◽  
Manale Noun ◽  
Serge Della-Negra ◽  
Raymond Tannous ◽  
Georges Chalhoub ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Mass Resolution ◽  
High Mass ◽  
Resolution Time ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Mass Spectrometry Application

Detection of lithium in scalp hair by time-of-flight secondary ion mass spectrometry with high energy (MeV) primary ions

2017 ◽  
Vol 9 (36) ◽  
pp. 5249-5253 ◽  
Author(s):  
Karen J. Cloete ◽  
Boštjan Jenčič ◽  
Žiga Šmit ◽  
Mitja Kelemen ◽  
Kwezikazi Mkentane ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Scalp Hair ◽  
Time Of Flight ◽  
High Energy ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

The application of MeV-SIMS is presented for the detection and mapping of lithium in chemically unprocessed, longitudinally sectioned scalp hair.

scholarly journals Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

2015 ◽  
Vol 29 (13) ◽  
pp. 1187-1195 ◽  
Author(s):  
Quentin P. Vanbellingen ◽  
Nicolas Elie ◽  
Michael J. Eller ◽  
Serge Della‐Negra ◽  
David Touboul ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Biological Samples ◽  
Mass Spectrometry Imaging ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Delayed Extraction ◽  
Secondary Ion

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]

1992 ◽  
Vol 47 (7) ◽  
pp. 929-936 ◽  
Author(s):  
Herbert Feld ◽  
Angelika Leute ◽  
Derk Rading ◽  
Alfred Benninghoven ◽  
G. Henkel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Metal Complexes ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Cluster Ions ◽  
High Mass ◽  
Plasma Desorption ◽  
Ion Mass Spectrometry ◽  
Thiolate Complexes ◽  
Secondary Ion

The use of mass spectrometry for the analysis of transition metal complexes is demonstrated by combined high resolution Plasma Desorption Mass Spectrometry (PDMS) and Secondary Ion Mass Spectrometry (SIMS) investigations of the neutral nickel thiolate complexes [Ni4(SC3H7)8] (1), [Ni4(SC6H11)8] (2), [Ni8(SCH2COOEt)16] (3) and [Ni6(SC3H7)12] (4). The positive spectra are dominated by three kinds of SI-species: (a) molecular ions, (b) fragment ions and (c) molecular ions with one or more substrate atoms attached. The negative spectra show mainly nickel sulfur cluster ions of the composition (NixSy)-. In contrast to many Fast Atom Bombardment (FAB) spectra of neutral metal complexes, SIMS and PDMS spectra provide molecular weight as well as fragment ion information. Both techniques are most powerful tools for the investigation of coordination compounds because the samples are easy to prepare and the spectra are independent of matrix conditions. Additionally crystallographic studies have been carried out for 4. The hexanuclear complex 4 with square planar Ni-S coordination sites crystallizes in the trigonal space group R 3̅ with Z = 3 and α = 18.537(5), c = 13.966(3) Å.

Time-of-flight secondary ion mass spectrometry with transmission of energetic primary cluster ions through foil targets

2014 ◽  
Vol 85 (3) ◽  
pp. 033107 ◽  
Author(s):  
K. Hirata ◽  
Y. Saitoh ◽  
A. Chiba ◽  
K. Yamada ◽  
S. Matoba ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Cluster Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Primary Cluster

Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments

1985 ◽  
Vol 57 (12) ◽  
pp. 2384-2388 ◽  
Author(s):  
Ioannis V. Bletsos ◽  
David M. Hercules ◽  
Dieter. Greifendorf ◽  
Alfred. Benninghoven
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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