Hot-Electron Injection and Charge Carrier Lifetime Prolongation Enhance the Photoelectrochemical Performance of a Plasmonic CdS/Au Photoanode

2021 ◽  
Author(s):  
Meng Jiang ◽  
Xuyi Liu ◽  
Manyu Zhang ◽  
Zhaojun Wu ◽  
Yajie Zheng ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Carrier Lifetime ◽  
Electron Injection ◽  
Hot Electron ◽  
Photoelectrochemical Performance ◽  
Hot Electron Injection ◽  
Charge Carrier Lifetime

Enhanced photoelectrochemical performance with plasmon-induced hot electron injection of gold nanoparticle

2019 ◽  
Vol 52 (12) ◽  
pp. 125503 ◽  
Author(s):  
Qingcui Ma ◽  
Xiaoniu Peng ◽  
Menglei Zhu ◽  
Xina Wang ◽  
Yuanyuan Wang ◽  
...  
Keyword(s):  
Gold Nanoparticle ◽  
Electron Injection ◽  
Hot Electron ◽  
Photoelectrochemical Performance ◽  
Hot Electron Injection

Rectification in Chiral Carbon Nanotubes with Hot Electron Injection

2020 ◽  
Vol 131 (3) ◽  
pp. 456-459
Author(s):  
S. S. Abukari ◽  
R. Musah ◽  
M. Amekpewu ◽  
S. Y. Mensah ◽  
N. G. Mensah ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Injection ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
Chiral Carbon

scholarly journals Extraordinarily High Minority Charge Carrier Lifetime Observed in Crystalline Silicon

Solar RRL ◽  
2021 ◽  
Author(s):  
Bernd Steinhauser ◽  
Tim Niewelt ◽  
Armin Richter ◽  
Rebekka Eberle ◽  
Martin Schubert
Keyword(s):  
Charge Carrier ◽  
Carrier Lifetime ◽  
Crystalline Silicon ◽  
Minority Charge Carrier ◽  
Charge Carrier Lifetime

scholarly journals Simulation of GaAs submicron FET with hot-electron injection structure

1983 ◽  
Vol 19 (17) ◽  
pp. 697 ◽  
Author(s):  
K. Tomizawa ◽  
Y. Awano ◽  
N. Hashizume ◽  
M. Kawashima
Keyword(s):  
Electron Injection ◽  
Hot Electron ◽  
Hot Electron Injection

Interface State Generation Mechanism in MOSFET's during Substrate Hot-Electron Injection

1988 ◽  
Vol 27 (Part 2, No. 12) ◽  
pp. L2395-L2397 ◽  
Author(s):  
Naoki Yasuda ◽  
Hiroshi Nakamura ◽  
Kenji Taniguchi ◽  
Chihiro Hamaguchi ◽  
Masakazu Kakumu
Keyword(s):  
Electron Injection ◽  
Interface State ◽  
Generation Mechanism ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
State Generation

Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories

2008 ◽  
Vol 52 (6) ◽  
pp. 844-848 ◽  
Author(s):  
Seung-Hwan Seo ◽  
Se-Woon Kim ◽  
Jang-Uk Lee ◽  
Gu-Cheol Kang ◽  
Kang-Seob Roh ◽  
...  
Keyword(s):  
Silicon Oxide ◽  
Electron Injection ◽  
Channel Width ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
Nitride Oxide ◽  
Cycling Behavior
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