Quantitative Imaging of Defect Distributions in CdZnTe Wafers Using Combined Deep-Level Photothermal Spectroscopy, Photocarrier Radiometry, and Lock-In Carrierography
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2003 ◽
Vol 74
(1)
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pp. 340-342
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2016 ◽
Vol 37
(4)
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Keyword(s):
2014 ◽
Vol 124
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pp. 133-137
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