Fine Structure of the Optical Absorption Resonance in Cs2AgBiBr6 Double Perovskite Thin Films

2020 ◽  
Vol 5 (2) ◽  
pp. 559-565 ◽  
Author(s):  
Alexander Schmitz ◽  
L. Leander Schaberg ◽  
Svetlana Sirotinskaya ◽  
Martina Pantaler ◽  
Doru C. Lupascu ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Optical Absorption ◽  
Double Perovskite ◽  
Absorption Resonance

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Influence of deposition parameters on the optical absorption of amorphous silicon thin films

2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Lukas Terkowski ◽  
Iain W. Martin ◽  
Daniel Axmann ◽  
Malte Behrendsen ◽  
Felix Pein ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Amorphous Silicon ◽  
Silicon Thin Films ◽  
Deposition Parameters

RBS study of epitaxially grown thin films of the double perovskite La2NiMnO6

2007 ◽  
Vol 261 (1-2) ◽  
pp. 686-689 ◽  
Author(s):  
S. Budak ◽  
C. Muntele ◽  
I. Muntele ◽  
H. Guo ◽  
A. Gupta ◽  
...  
Keyword(s):  
Thin Films ◽  
Double Perovskite

Conductivity and optical absorption in amorphous gallium sulphide thin films

1989 ◽  
Vol 172 (2) ◽  
pp. 179-183 ◽  
Author(s):  
G. Micocci ◽  
R. Rella ◽  
A. Tepore
Keyword(s):  
Thin Films ◽  
Optical Absorption

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

1993 ◽  
Vol 65-66 ◽  
pp. 313-318 ◽  
Author(s):  
M. Di Giulio ◽  
M.C. Nicotra ◽  
M. Re ◽  
R. Rella ◽  
P. Siciliano
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Structural Characterization

Quantitative photopyroelectric out-of-phase spectroscopy of amorphous silicon thin films deposited on crystalline silicon

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Dynamic Range ◽  
Crystalline Silicon ◽  
Optical Absorption Coefficient ◽  
Si Substrates ◽  
Silicon Thin Films ◽  
Background Compensation

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.

scholarly journals Protein Dynamics in an Intermediate State of Myoglobin: Optical Absorption, Resonance Raman Spectroscopy, and X-Ray Structure Analysis

2000 ◽  
Vol 78 (4) ◽  
pp. 2081-2092 ◽  
Author(s):  
Niklas Engler ◽  
Andreas Ostermann ◽  
Alexandra Gassmann ◽  
Don C. Lamb ◽  
Valeri E. Prusakov ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Optical Absorption ◽  
Protein Dynamics ◽  
Structure Analysis ◽  
Intermediate State ◽  
Resonance Raman Spectroscopy ◽  
Resonance Raman ◽  
X Ray ◽  
Absorption Resonance
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