Near-Field Mapping of Photonic Eigenmodes in Patterned Silicon Nanocavities by Electron Energy-Loss Spectroscopy

AbstractWe revisit plasmon modes in nanoparticle dimers with conductive or insulating junction resulting in conductive or capacitive coupling. In our study, which combines electron energy loss spectroscopy, optical spectroscopy, and numerical simulations, we show the coexistence of strongly and weakly hybridised modes. While the properties of the former ones strongly depend on the nature of the junction, the properties of the latter ones are nearly unaffected. This opens up a prospect for independent engineering of individual plasmon modes in a single plasmonic antenna. In addition, we show that Babinet’s principle allows to engineer the near field of plasmon modes independent of their energy. Finally, we demonstrate that combined electron energy loss imaging of a plasmonic antenna and its Babinet-complementary counterpart allows to reconstruct the distribution of both electric and magnetic near fields of localised plasmon resonances supported by the antenna, as well as charge and current antinodes of related charge oscillations.

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Thermal near-field tuning of silicon Mie nanoparticles

Nanophotonics ◽

10.1515/nanoph-2021-0424 ◽

2021 ◽

Vol 0 (0) ◽

Author(s):

Artyom Assadillayev ◽

Tatsuki Hinamoto ◽

Minoru Fujii ◽

Hiroshi Sugimoto ◽

Søren Raza

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Light Emission ◽

Near Field ◽

High Refractive Index ◽

Visible Range ◽

Stable Operation ◽

Spectral Shifts ◽

Electron Energy Loss

Abstract Tunable high-refractive-index nanostructures are highly desired for realizing photonic devices with a compact footprint. By harnessing the large thermo-optic effect in silicon, we show reversible and wide thermal tuning of both the far- and near-fields of Mie resonances in isolated silicon nanospheres in the visible range. We perform in situ heating in a transmission electron microscope and electron energy-loss spectroscopy to show that the Mie resonances exhibit large spectral shifts upon heating. We leverage the spectral shifts to demonstrate near-field tuning between different Mie resonances. By combining electron energy-loss spectroscopy with energy-dispersive X-ray analysis, we show a reversible and stable operation of single silicon nanospheres up to a temperature of 1073 K. Our results demonstrate that thermal actuation offers dynamic near-field tuning of Mie resonances, which may open up applications in tunable nonlinear optics, Raman scattering, and light emission.

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Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078699 ◽

1977 ◽

Vol 35 ◽

pp. 232-233 ◽

Cited By ~ 1

Author(s):

P. Trebbia ◽

P. Ballongue ◽

C. Colliex

Keyword(s):

Electron Microscope ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Single Channel ◽

Detection System ◽

Surface Barrier ◽

Solid State Detector ◽

Electrostatic Mirror ◽

Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

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Trends in Electron Energy Loss Spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078675 ◽

1977 ◽

Vol 35 ◽

pp. 228-229

Author(s):

C. Colliex ◽

P. Trebbia

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Materials Science ◽

Analytical Technique ◽

Recent Developments ◽

Quantitative Results ◽

Electron Microscopes ◽

Electron Energy Loss ◽

Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

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