Use of high lateral resolution secondary-ion mass spectrometry to characterize self-assembled monolayers on microfabricated structures

1992 ◽  
Vol 114 (18) ◽  
pp. 7142-7145 ◽  
Author(s):  
C. Daniel Frisbie ◽  
John R. Martin ◽  
Ronald R. Duff ◽  
Mark S. Wrighton
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