Use of High Lateral Resolution Secondary Ion Mass Spectrometry to Characterize Self-Assembled Monolayers on Microfabricated Structures

1992 ◽  
Author(s):  
C. D. Frisbie ◽  
J. R. Martin ◽  
R. R. Duff ◽  
Wrighton Jr. ◽  
M. S.
2006 ◽  
Vol 78 (6) ◽  
pp. 1913-1920 ◽  
Author(s):  
Young-Pil Kim ◽  
Eunkeu Oh ◽  
Mi-Young Hong ◽  
Dohoon Lee ◽  
Min-Kyu Han ◽  
...  

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