Use of High Lateral Resolution Secondary Ion Mass Spectrometry to Characterize Self-Assembled Monolayers on Microfabricated Structures
1992 ◽
Vol 114
(18)
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pp. 7142-7145
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2005 ◽
Vol 23
(11)
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pp. 653-659
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Secondary ion mass spectrometry for characterizing photopatterned, self‐assembled monolayers on gold
1993 ◽
Vol 11
(4)
◽
pp. 2368-2372
◽
2000 ◽
Vol 18
(4)
◽
pp. 1114-1118
◽