Film Growth of Ice by Vapor Deposition at 128−185 K Studied by Fourier Transform Infrared Reflection−Absorption Spectroscopy: Evolution of the OH Stretch and the Dangling Bond with Film Thickness
2002 ◽
Vol 106
(24)
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pp. 6234-6247
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1983 ◽
Vol 30
(1)
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pp. 43-50
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1984 ◽
Vol 88
(7)
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pp. 1275-1277
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1993 ◽
Vol 11
(4)
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pp. 1957-1963
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1991 ◽
Vol 94
(9)
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pp. 6256-6263
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1992 ◽
Vol 97
(12)
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pp. 9396-9411
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1998 ◽
Vol 102
(43)
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pp. 8498-8504
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