Nanoconfinement of Ionic Liquid and Polymers in Supported Thin Films: A Time-of-Flight Secondary Ion Mass Spectrometry Study of Surface Diffusion

The Journal of Physical Chemistry C ◽

10.1021/jp404816t ◽

2013 ◽

Vol 117 (41) ◽

pp. 21281-21287 ◽

Author(s):

Ryutaro Souda

Keyword(s):

Mass Spectrometry ◽

Ionic Liquid ◽

Surface Diffusion ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2011.04.018 ◽

2011 ◽

Vol 519 (18) ◽

pp. 6183-6189 ◽

Author(s):

Karl E. Mayerhofer ◽

Jakob Heier ◽

Ylenia Maniglio ◽

Beat Andreas Keller

Keyword(s):

Mass Spectrometry ◽

Dimensional Analysis ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Time Of Flight ◽

Organic Thin Films ◽

Ion Mass Spectrometry ◽

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Time-of-flight secondary ion mass spectrometry study of lithium intercalation process in LiCoO2 thin film

Journal of Power Sources ◽

10.1016/j.jpowsour.2016.04.084 ◽

2016 ◽

Vol 321 ◽

pp. 241-247 ◽

Author(s):

C. Dellen ◽

H.-G. Gehrke ◽

S. Möller ◽

C.-L. Tsai ◽

U. Breuer ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lithium Intercalation ◽

Intercalation Process ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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Time‐of‐flight secondary ion mass spectrometry study of P2S5/(NH4)2S‐ and ultraviolet/ozone‐treated GaAs

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578612 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2597-2602 ◽

Author(s):

J. Bennett ◽

J. A. Dagata

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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Time-of-flight static secondary ion mass spectrometry study of imidization in pyromellitic dianhydride-4,4'-oxydianiline polyimide films

Macromolecules ◽

10.1021/ma00011a026 ◽

1991 ◽

Vol 24 (11) ◽

pp. 3209-3214 ◽

Author(s):

B. N. Eldridge ◽

C. Feger ◽

M. J. Goldberg ◽

W. Reuter ◽

G. J. Scilla

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Pyromellitic Dianhydride ◽

Polyimide Films ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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Rapid identification of trimethyl and triethyl amines using sulphonic acidic ionic liquids: A time-of-flight secondary ion mass spectrometry study of fragmentation reactions

Analytica Chimica Acta ◽

10.1016/j.aca.2012.10.055 ◽

2012 ◽

Vol 757 ◽

pp. 48-55 ◽

Author(s):

Bhaskar Garg ◽

Shiou-Ling Lei ◽

Shou-Ching Liu ◽

Tanuja Bisht ◽

Jen-Yu Liu ◽

...

Keyword(s):

Mass Spectrometry ◽

Ionic Liquids ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Rapid Identification ◽

Mass Spectrometry Study ◽

Acidic Ionic Liquids ◽

Ion Mass Spectrometry ◽

Fragmentation Reactions ◽

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Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Angewandte Chemie International Edition in English ◽

10.1002/anie.199410231 ◽

1994 ◽

Vol 33 (10) ◽

pp. 1023-1043 ◽

Author(s):

Alfred Benninghoven

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Organic Surfaces ◽

Secondary Ion ◽

Inorganic And Organic

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Time-of-flight secondary ion mass spectrometry study of zinc carbonation in the presence of stable oxygen-18 and deuterium isotopes

Materials Chemistry and Physics ◽

10.1016/j.matchemphys.2020.123673 ◽

2020 ◽

Vol 256 ◽

pp. 123673

Author(s):

Ville Saarimaa ◽

Aaretti Kaleva ◽

Juha-Pekka Nikkanen ◽

Erkki Levänen ◽

Pasi Väisänen ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Stable Oxygen ◽

Deuterium Isotopes ◽

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Temperature-programmed time of flight secondary ion mass spectrometry study of hydration of ammonia and formic acid adsorbed on the water–ice surface

The Journal of Chemical Physics ◽

10.1063/1.1587692 ◽

2003 ◽

Vol 119 (5) ◽

pp. 2774-2779 ◽

Author(s):

Ryutaro Souda

Keyword(s):

Mass Spectrometry ◽

Formic Acid ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Water Ice ◽

Ice Surface ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Temperature Programmed ◽

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Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O2+ ion bombardment

Thin Solid Films ◽

10.1016/j.tsf.2018.10.049 ◽

2019 ◽

Vol 669 ◽

pp. 188-197

Author(s):

X.L. Yan ◽

M.M. Duvenhage ◽

J.Y. Wang ◽

H.C. Swart ◽

J.J. Terblans

Keyword(s):

Mass Spectrometry ◽

Surface Roughness ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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Time-of-Flight Secondary Ion Mass Spectrometry Study of the Orientation of a Bifunctional Diblock Copolymer Attached to a Solid Substrate

Langmuir ◽

10.1021/la802016b ◽

2009 ◽

Vol 25 (2) ◽

pp. 1011-1019 ◽

Author(s):

Marek Jasieniak ◽

Shuko Suzuki ◽

Michael Monteiro ◽

Edeline Wentrup-Byrne ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Diblock Copolymer ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Solid Substrate ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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