Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry
2001 ◽
Vol 22
(11)
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pp. 829-834
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1994 ◽
Vol 33
(10)
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pp. 1023-1043
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2013 ◽
Vol 117
(41)
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pp. 21281-21287
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1998 ◽
Vol 12
(19)
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pp. 1303-1312
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2019 ◽
Vol 107
(10)
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pp. 2195-2204
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