Tapping Mode Atomic Force Microscopy Investigation of Poly(amidoamine) Core−Shell Tecto(dendrimers) Using Carbon Nanoprobes

Langmuir ◽  
2002 ◽  
Vol 18 (8) ◽  
pp. 3127-3133 ◽  
Author(s):  
Theodore A. Betley ◽  
Jessica A. Hessler ◽  
Almut Mecke ◽  
Mark M. Banaszak Holl ◽  
Bradford G. Orr ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force Microscopy Investigation ◽  
Atomic Force ◽  
Microscopy Investigation ◽  
Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy Investigation of Poly(amidoamine) Dendrimers:  Effects of Substrate and pH on Dendrimer Deformation

Langmuir ◽  
2001 ◽  
Vol 17 (9) ◽  
pp. 2768-2773 ◽  
Author(s):  
Theodore A. Betley ◽  
Mark M. Banaszak Holl ◽  
Bradford G. Orr ◽  
Douglas R. Swanson ◽  
Donald A. Tomalia ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force Microscopy Investigation ◽  
Atomic Force ◽  
Microscopy Investigation ◽  
Mode Atomic Force Microscopy

Characterizations of Core−Shell Tecto-(Dendrimer) Molecules by Tapping Mode Atomic Force Microscopy

Langmuir ◽  
1999 ◽  
Vol 15 (21) ◽  
pp. 7347-7350 ◽  
Author(s):  
J. Li ◽  
D. R. Swanson ◽  
D. Qin ◽  
H. M. Brothers ◽  
L. T. Piehler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

1999 ◽  
Vol 75 (26) ◽  
pp. 4198-4200 ◽  
Author(s):  
G. Bar ◽  
L. Delineau ◽  
R. Brandsch ◽  
M. Bruch ◽  
M.-H. Whangbo
Keyword(s):  
Atomic Force Microscopy ◽  
Indentation Depth ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Effect of Viscoelastic Properties of Polymers on the Phase Shift in Tapping Mode Atomic Force Microscopy

Langmuir ◽  
1998 ◽  
Vol 14 (26) ◽  
pp. 7343-7347 ◽  
Author(s):  
Georg Bar ◽  
Rainer Brandsch ◽  
Myung-Hwan Whangbo
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Shift ◽  
Viscoelastic Properties ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Characterization of Self-Assembled Dendritic Complex with Pt(II) Ion Using Tapping-Mode Atomic Force Microscopy

2004 ◽  
Vol 425 (1) ◽  
pp. 61-67
Author(s):  
K. H. Jung ◽  
H. K. Shin ◽  
Y. S. Kwon ◽  
H. Kim ◽  
C. Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Mode Atomic Force Microscopy
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