Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

1999 ◽  
Vol 75 (26) ◽  
pp. 4198-4200 ◽  
Author(s):  
G. Bar ◽  
L. Delineau ◽  
R. Brandsch ◽  
M. Bruch ◽  
M.-H. Whangbo
Keyword(s):  
Atomic Force Microscopy ◽  
Indentation Depth ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Discrimination of Dendrimer Aggregates on Mica Based on Adhesion Force:  A Pulsed Force Mode Atomic Force Microscopy Study

Langmuir ◽  
2000 ◽  
Vol 16 (24) ◽  
pp. 9294-9298 ◽  
Author(s):  
Hua Zhang ◽  
P. C. M. Grim ◽  
T. Vosch ◽  
U.-M. Wiesler ◽  
A. J. Berresheim ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Mode Atomic Force Microscopy

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force
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