Nanoscale Indentation of Polymer and Composite Polymer−Silica Core−Shell Submicrometer Particles by Atomic Force Microscopy

Langmuir ◽  
2007 ◽  
Vol 23 (4) ◽  
pp. 2007-2014 ◽  
Author(s):  
Silvia Armini ◽  
Ivan U. Vakarelski ◽  
Caroline M. Whelan ◽  
Karen Maex ◽  
Ko Higashitani
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Composite Polymer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Silica Core

Synthesis and Nanomechanical Properties of Polystyrene/Silica Core/Shell Particles Via Atomic Force Microscopy

Langmuir ◽  
2021 ◽  
Author(s):  
Hamid Akbari Moayyer ◽  
Malek Naderi ◽  
Jamshid Aghazadeh Mohandesi
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Atomic Force ◽  
Silica Core ◽  
Shell Particles

Influence of Isomorphous Substituting Cobalt Ions on the Crystal Growth of the MOF-5 Framework Determined by Atomic Force Microscopy of Growing Core–Shell Crystals

2013 ◽  
Vol 13 (10) ◽  
pp. 4526-4532 ◽  
Author(s):  
Pablo Cubillas ◽  
Michael W. Anderson ◽  
Martin P. Attfield
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Core Shell ◽  
Cobalt Ions ◽  
Force Microscopy ◽  
Atomic Force

Tapping Mode Atomic Force Microscopy Investigation of Poly(amidoamine) Core−Shell Tecto(dendrimers) Using Carbon Nanoprobes

Langmuir ◽  
2002 ◽  
Vol 18 (8) ◽  
pp. 3127-3133 ◽  
Author(s):  
Theodore A. Betley ◽  
Jessica A. Hessler ◽  
Almut Mecke ◽  
Mark M. Banaszak Holl ◽  
Bradford G. Orr ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force Microscopy Investigation ◽  
Atomic Force ◽  
Microscopy Investigation ◽  
Mode Atomic Force Microscopy

Probing pH-Tuned Morphological Changes in Core−Shell Nanoparticle Assembly Using Atomic Force Microscopy

Nano Letters ◽  
2001 ◽  
Vol 1 (10) ◽  
pp. 575-579 ◽  
Author(s):  
Mathew M. Maye ◽  
Jin Luo ◽  
Li Han ◽  
Chuan-Jian Zhong
Keyword(s):  
Atomic Force Microscopy ◽  
Morphological Changes ◽  
Nanoparticle Assembly ◽  
Core Shell ◽  
Force Microscopy ◽  
Atomic Force

Atomic-force microscopy of a fractured rubber-toughened epoxy

1994 ◽  
Vol 52 ◽  
pp. 888-889
Author(s):  
O. Shaffer ◽  
J. Qian ◽  
V. Dimonie ◽  
R. Pearson ◽  
M. El-Aasser
Keyword(s):  
Atomic Force Microscopy ◽  
Crosslinking Agent ◽  
Core Shell ◽  
Physical Interaction ◽  
Latex Particles ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Rubber Toughened ◽  
Shell Particles

Atomic force microscopy (AFM) is a powerful scanning probe technique, which is capable of imaging polymer surfaces. This technique is complementary to the scanning electron microscope (SEM) but because of the AFM's sensitivity in the z direction surfaces that are too smooth to image by SEM can easily be imaged by AFM. This study utilizes transmission electron microscopy(TEM) to image the morphology of the latex rubber particles; SEM and AFM are used to study the degree of dispensability of the latex particles in the epoxy, and the fatigue-fracture surface of the rubber modified epoxy.Core-shell latex particles were prepared with a core of poly(butadiene-styreiie) |P(B-S)| and a shell Poly(methyl methacrylate)(PMMA). In order to study the interaction between the core/shell particles and the epoxy matrix, the shell is systematically varied in terms of chemical bonding, physical interaction and the extent of these interactions by incorporating acrylonitrile(AN). glycidyl-methacrylate(GMA). and crosslinking agent divinylbenzene(DVB) of varying concentrations in the shell.

Characterizations of Core−Shell Tecto-(Dendrimer) Molecules by Tapping Mode Atomic Force Microscopy

Langmuir ◽  
1999 ◽  
Vol 15 (21) ◽  
pp. 7347-7350 ◽  
Author(s):  
J. Li ◽  
D. R. Swanson ◽  
D. Qin ◽  
H. M. Brothers ◽  
L. T. Piehler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Core Shell ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Nanoscale characterization of all-oxide core-shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

2021 ◽  
Author(s):  
Illia Dobryden ◽  
Riccardo Borgani ◽  
Federica Rigoni ◽  
Pedram Ghamgosar ◽  
Isabella Concina ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Contact Potential Difference ◽  
Core Shell ◽  
Contact Potential ◽  
Distribution Maps ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

The electrical properties of an all-oxide core-shell ZnO-Co3O4 nanorod heterojunction were studied in dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new...

Measurement of the young's modulus of composite polymer coatings using atomic force microscopy

2020 ◽  
Author(s):  
A. V. Nomoev ◽  
V. Th. Lygdenov ◽  
E. Ch. Khartaeva ◽  
V. V. Lygdenov ◽  
V. N. Mankhirov
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Polymer Coatings ◽  
Composite Polymer ◽  
Force Microscopy ◽  
Atomic Force
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