scholarly journals Nanoscale characterization of all-oxide core-shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

2021 ◽  
Author(s):  
Illia Dobryden ◽  
Riccardo Borgani ◽  
Federica Rigoni ◽  
Pedram Ghamgosar ◽  
Isabella Concina ◽  
...  

The electrical properties of an all-oxide core-shell ZnO-Co3O4 nanorod heterojunction were studied in dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new...

2004 ◽  
Vol 10 (S02) ◽  
pp. 1102-1103
Author(s):  
Guangchun Cui ◽  
Rosario A Gerhardt

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.


2020 ◽  
Vol 20 (1) ◽  
pp. 37-41
Author(s):  
Andrielle Thainar Mendes Cunha ◽  
Luciano Paulino Silva ◽  
José Oliveira Carvalho ◽  
Margot Alves Nunes Dode

2019 ◽  
Vol 669 ◽  
pp. 120-132 ◽  
Author(s):  
Tonya Coffey ◽  
Andrew Seredinski ◽  
Jake N. Poler ◽  
Crystal Patteson ◽  
William H. Watts ◽  
...  

Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemin ◽  
Pascal Carriere ◽  
Aymen Amine Assadi ◽  
Dinh Duc Nguyen

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. In this perspective paper, we review recent progress in the use of AFM-IR in polymer science. We describe first the principle of AFM-IR and the recent improvements to enhance its resolution. We discuss then the last progress in the use of AFM-IR as a super-resolution correlated scanned-probe IR spectroscopy for chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers and biopolymers. To highlight the advantages of AFM-IR, we report here several results in studying crystallization of both miscible and immiscible blends as well as polymer aging. Then, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure and crystallization mechanisms at the nanoscale, which have never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.


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