On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy

Langmuir ◽

10.1021/la970822i ◽

1997 ◽

Vol 13 (24) ◽

pp. 6349-6353 ◽

Author(s):

R. Brandsch ◽

G. Bar ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Factors Affecting ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phase Images ◽

Mode Atomic Force Microscopy

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Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-co-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)

Langmuir ◽

10.1021/la970091m ◽

1997 ◽

Vol 13 (14) ◽

pp. 3807-3812 ◽

Author(s):

G. Bar ◽

Y. Thomann ◽

R. Brandsch ◽

H.-J. Cantow ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Polymer Blends ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Factors Affecting ◽

Force Microscopy ◽

Atomic Force ◽

Phenylene Oxide ◽

Phase Images ◽

Mode Atomic Force Microscopy

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The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate

Applied Surface Science ◽

10.1016/s0169-4332(02)00184-8 ◽

2002 ◽

Vol 191 (1-4) ◽

pp. 240-246 ◽

Author(s):

Peng Jiang ◽

Si-shen Xie ◽

Shi-jin Pang ◽

Hong-jun Gao

Keyword(s):

Atomic Force Microscopy ◽

Gold Nanoparticle ◽

Solid Substrate ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phase Images ◽

Nanoparticle Film ◽

Mode Atomic Force Microscopy

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Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers

Applied Physics A ◽

10.1007/s003390051340 ◽

1998 ◽

Vol 66 (7) ◽

pp. S1267-S1270 ◽

Author(s):

M.H. Whangbo ◽

G. Bar ◽

R. Brandsch

Keyword(s):

Atomic Force Microscopy ◽

Self Assembled Monolayers ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phase Images ◽

Assembled Monolayers ◽

Self Assembled ◽

Mode Atomic Force Microscopy

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Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Review of Scientific Instruments ◽

10.1063/1.2801009 ◽

2007 ◽

Vol 78 (10) ◽

pp. 103707 ◽

Author(s):

Ozgur Sahin

Keyword(s):

Atomic Force Microscopy ◽

Time Varying ◽

Force Measurements ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Effect of Viscoelastic Properties of Polymers on the Phase Shift in Tapping Mode Atomic Force Microscopy

Langmuir ◽

10.1021/la980969p ◽

1998 ◽

Vol 14 (26) ◽

pp. 7343-7347 ◽

Author(s):

Georg Bar ◽

Rainer Brandsch ◽

Myung-Hwan Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Phase Shift ◽

Viscoelastic Properties ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽

10.1021/la9908844 ◽

1999 ◽

Vol 15 (25) ◽

pp. 8569-8573 ◽

Author(s):

William E. Farneth ◽

R. Scott McLean ◽

John D. Bolt ◽

Eleni Dokou ◽

Mark A. Barteau

Keyword(s):

Atomic Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Characterization of Self-Assembled Dendritic Complex with Pt(II) Ion Using Tapping-Mode Atomic Force Microscopy

Molecular Crystals and Liquid Crystals ◽

10.1080/15421400490506513 ◽

2004 ◽

Vol 425 (1) ◽

pp. 61-67

Author(s):

K. H. Jung ◽

H. K. Shin ◽

Y. S. Kwon ◽

H. Kim ◽

C. Kim

Keyword(s):

Atomic Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled ◽

Mode Atomic Force Microscopy

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TAPPING MODE ATOMIC FORCE MICROSCOPY OF HYALURONAN AND HYLAN A

10.1533/9781845693121.117 ◽

2002 ◽

pp. 109-116 ◽

Author(s):

Mary K. Cowman ◽

Min Li ◽

Ansil Dyal ◽

Sonoko Kanai

Keyword(s):

Atomic Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Characterization of membrane distillation membranes by tapping mode atomic force microscopy

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50023-9 ◽

2005 ◽

pp. 141-148

Author(s):

M KHAYET

Keyword(s):

Atomic Force Microscopy ◽

Membrane Distillation ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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