Characterization of Polyelectrolyte−Protein Multilayer Films by Atomic Force Microscopy, Scanning Electron Microscopy, and Fourier Transform Infrared Reflection−Absorption Spectroscopy

Frank Caruso; D. Neil Furlong; Katsuhiko Ariga; Izumi Ichinose; Toyoki Kunitake

doi:10.1021/la971288h

Characterization of Polyelectrolyte−Protein Multilayer Films by Atomic Force Microscopy, Scanning Electron Microscopy, and Fourier Transform Infrared Reflection−Absorption Spectroscopy

Langmuir ◽

10.1021/la971288h ◽

1998 ◽

Vol 14 (16) ◽

pp. 4559-4565 ◽

Cited By ~ 210

Author(s):

Frank Caruso ◽

D. Neil Furlong ◽

Katsuhiko Ariga ◽

Izumi Ichinose ◽

Toyoki Kunitake

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Multilayer Films ◽

Force Microscopy ◽

Infrared Reflection Absorption Spectroscopy ◽

Atomic Force ◽

Infrared Reflection ◽

Scanning Electron

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Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

Scanning Electron

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Atomic force microscopy, scanning electron microscopy and electrochemical characterization of Al alloys, conversion coatings, and primers used for aircraft

Progress in Organic Coatings ◽

10.1016/s0300-9440(97)00097-0 ◽

1997 ◽

Vol 32 (1-4) ◽

pp. 25-30 ◽

Cited By ~ 27

Author(s):

G.P Bierwagen ◽

Rebecca Twite ◽

G Chen ◽

D.E Tallman

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Al Alloys ◽

Electrochemical Characterization ◽

Conversion Coatings ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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3-D morphological characterization of the liver parenchyma by atomic force microscopy and by scanning electron microscopy

Microscopy Research and Technique ◽

10.1002/jemt.20045 ◽

2004 ◽

Vol 64 (1) ◽

pp. 1-9 ◽

Cited By ~ 10

Author(s):

Mahmoud Melling ◽

Daniela Karimian-Teherani ◽

Sascha Mostler ◽

Mark Behnam ◽

Sonja Hochmeister

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Liver Parenchyma ◽

Morphological Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

Philosophical Magazine A ◽

10.1080/01418610208240053 ◽

2002 ◽

Vol 82 (13) ◽

pp. 2575-2589 ◽

Cited By ~ 6

Author(s):

B. Fruhstorfer ◽

V. Mohles ◽

R. Reichelt ◽

E. Nembach

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Second Phase ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Second Phase Particles ◽

Scanning Electron

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Quantitative characterization of the electrospun gelatin–chitosan nanofibers by coupling scanning electron microscopy and atomic force microscopy

Materials Letters ◽

10.1016/j.matlet.2012.03.044 ◽

2012 ◽

Vol 79 ◽

pp. 14-17 ◽

Cited By ~ 9

Author(s):

Shilu Wang ◽

Guoming Zhao

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Electrospun Gelatin ◽

Scanning Electron

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Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM)

Bulletin of the Korean Chemical Society ◽

10.5012/bkcs.2008.29.11.2114 ◽

2008 ◽

Vol 29 (11) ◽

pp. 2114-2118 ◽

Cited By ~ 11

Keyword(s):

Electron Microscopy ◽

Escherichia Coli ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Laminar Flow ◽

Force Microscopy ◽

Atomic Force ◽

Nanoscale Characterization ◽

Scanning Electron

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Characterization of protein immobilization on nanoporous gold using atomic force microscopy and scanning electron microscopy

Nanoscale ◽

10.1039/c1nr10427f ◽

2011 ◽

Vol 3 (8) ◽

pp. 3395 ◽

Cited By ~ 31

Author(s):

Yih Horng Tan ◽

John R. Schallom ◽

N. Vijaya Ganesh ◽

Kohki Fujikawa ◽

Alexei V. Demchenko ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Protein Immobilization ◽

Nanoporous Gold ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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Physical characterization of swine and human skin: Correlations between Raman spectroscopy, Tensile testing, Atomic force microscopy (AFM), Scanning electron microscopy (SEM), and Multiphoton microscopy (MPM)

Skin Research and Technology ◽

10.1111/srt.12976 ◽

2020 ◽

Author(s):

Pratima Labroo ◽

Jennifer Irvin ◽

Joshua Johnson ◽

Michael Sieverts ◽

James Miess ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Tensile Testing ◽

Multiphoton Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy

AIP Advances ◽

10.1063/1.4897340 ◽

2014 ◽

Vol 4 (10) ◽

pp. 107101 ◽

Cited By ~ 3

Author(s):

Pia C. Lansåker ◽

Anders Hallén ◽

Gunnar A. Niklasson ◽

Claes G. Granqvist

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Image Analysis ◽

Gold Nanoparticle ◽

Rutherford Backscattering ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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Nanoscopic characterization of a plastisol gelation and fusion process utilizing scanning electron microscopy and atomic force microscopy

Journal of Vinyl and Additive Technology ◽

10.1002/vnl.20153 ◽

2008 ◽

Vol 14 (3) ◽

pp. 99-104 ◽

Cited By ~ 8

Author(s):

Jerome S. Jourdan ◽

David P. Owen

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Fusion Process ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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