Surface Interaction Forces of Well-Defined, High-Density Polymer Brushes Studied by Atomic Force Microscopy. 1. Effect of Chain Length

2000 ◽  
Vol 33 (15) ◽  
pp. 5602-5607 ◽  
Author(s):  
Shinpei Yamamoto ◽  
Muhammad Ejaz ◽  
Yoshinobu Tsujii ◽  
Mutsuo Matsumoto ◽  
Takeshi Fukuda
Keyword(s):  
Atomic Force Microscopy ◽  
Chain Length ◽  
Polymer Brushes ◽  
Surface Interaction ◽  
High Density ◽  
Interaction Forces ◽  
Force Microscopy ◽  
Atomic Force

Surface Interaction Forces of Well-Defined, High-Density Polymer Brushes Studied by Atomic Force Microscopy. 2. Effect of Graft Density

2000 ◽  
Vol 33 (15) ◽  
pp. 5608-5612 ◽  
Author(s):  
Shinpei Yamamoto ◽  
Muhammad Ejaz ◽  
Yoshinobu Tsujii ◽  
Takeshi Fukuda
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brushes ◽  
Surface Interaction ◽  
High Density ◽  
Interaction Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Graft Density

Characterization of Electron Emission from High Density Self-Aligned Si-Based Quantum Dots by Conducting-Probe Atomic Force Microscopy

2014 ◽  
Vol 64 (6) ◽  
pp. 923-928 ◽  
Author(s):  
D. Takeuchi ◽  
K. Makihara ◽  
A. Ohta ◽  
M. Ikeda ◽  
S. Miyazaki
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Electron Emission ◽  
High Density ◽  
Force Microscopy ◽  
Atomic Force

A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: application of a compressible fluid model

Nanoscale ◽  
2013 ◽  
Vol 5 (23) ◽  
pp. 11679 ◽  
Author(s):  
José Luis Cuellar ◽  
Irantzu Llarena ◽  
Jagoba J. Iturri ◽  
Edwin Donath ◽  
Sergio Enrique Moya
Keyword(s):  
Atomic Force Microscopy ◽  
Compressible Fluid ◽  
Polymer Brushes ◽  
Fluid Model ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach
Sign in / Sign up

Export Citation Format

Share Document