A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: application of a compressible fluid model

Nanoscale ◽  
2013 ◽  
Vol 5 (23) ◽  
pp. 11679 ◽  
Author(s):  
José Luis Cuellar ◽  
Irantzu Llarena ◽  
Jagoba J. Iturri ◽  
Edwin Donath ◽  
Sergio Enrique Moya
Keyword(s):  
Atomic Force Microscopy ◽  
Compressible Fluid ◽  
Polymer Brushes ◽  
Fluid Model ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach

scholarly journals Atomic force microscopy recognition of protein A onStaphylococcus aureuscell surfaces by labelling with IgG–Au conjugates

2013 ◽  
Vol 4 ◽  
pp. 743-749 ◽  
Author(s):  
Elena B Tatlybaeva ◽  
Hike N Nikiyan ◽  
Alexey S Vasilchenko ◽  
Dmitri G Deryabin
Keyword(s):  
Atomic Force Microscopy ◽  
Protein A ◽  
Bacterial Cells ◽  
Force Microscopy ◽  
Selective Labelling ◽  
Atomic Force ◽  
Novel Approach ◽  
Preferential Binding ◽  
Igg Receptors ◽  
Labelling Method

The labelling of functional molecules on the surface of bacterial cells is one way to recognize the bacteria. In this work, we have developed a method for the selective labelling of protein A on the cell surfaces ofStaphylococcus aureusby using nanosized immunogold conjugates as cell-surface markers for atomic force microscopy (AFM). The use of 30-nm size Au nanoparticles conjugated with immunoglobulin G (IgG) allowed the visualization, localization and distribution of protein A–IgG complexes on the surface ofS. aureus. The selectivity of the labelling method was confirmed in mixtures ofS. aureuswithBacillus licheniformiscells, which differed by size and shape and had no IgG receptors on the surface. A preferential binding of the IgG–Au conjugates toS. aureuswas obtained. Thus, this novel approach allows the identification of protein A and other IgG receptor-bearing bacteria, which is useful for AFM indication of pathogenic microorganisms in poly-component associations.

Two Dimensional Imaging of the Laterally Inhomogeneous Au/4H-SiC Schottky Barrier by Conductive Atomic Force Microscopy

2007 ◽  
Vol 556-557 ◽  
pp. 545-548 ◽  
Author(s):  
Filippo Giannazzo ◽  
Fabrizio Roccaforte ◽  
S.F. Liotta ◽  
Vito Raineri
Keyword(s):  
Atomic Force Microscopy ◽  
Schottky Barrier ◽  
Schottky Contact ◽  
Surface Preparation ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force ◽  
Novel Approach ◽  
Inhomogeneous Character

We present a novel approach based on conductive atomic force microscopy (c-AFM) for nano-scale mapping of the Schottky barrier height (SBH) between a semiconductor and an ultrathin (1-5 nm) metal film. The method was applied to characterize the uniformity of the Au/4H-SiC Schottky contact, which is attractive for applications due to the high reported (∼1.8 eV) SBH value. Since this system is very sensitive to the SiC surface preparation, we investigated the effect on the nano-scale SBH distribution of a ∼2 nm thick not uniform SiO2 layer. The macroscopic I-V characteristics on Au/SiC and Au/not uniform SiO2/SiC diodes showed that the interfacial oxide lowers the average SBH. The c-AFM investigation is carried out collecting arrays of I-V curves for different tip positions on 1μm×1μm area. From these curves, 2D SBH maps are obtained with 10- 20 nm spatial resolution and energy resolution <0.1 eV. The laterally inhomogeneous character of the Au/SiC contact is demonstrated. In fact, a SBH distribution peaked at 1.8 eV and with tails from 1.6 eV to 2.1 eV is obtained. Moreover, in the presence of the not uniform oxide at the interface, the SBH distribution exhibits a 0.3 eV peak lowering and a broadening (tails from 1.1 eV to 2.1 eV).

Magnetostriction measurements with atomic force microscopy: a novel approach

2004 ◽  
Vol 268 (1-2) ◽  
pp. 198-204 ◽  
Author(s):  
A.C Papageorgopoulos ◽  
H. Wang ◽  
C. Guerrero ◽  
N. Garcia
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach

Surface Interaction Forces of Well-Defined, High-Density Polymer Brushes Studied by Atomic Force Microscopy. 1. Effect of Chain Length

2000 ◽  
Vol 33 (15) ◽  
pp. 5602-5607 ◽  
Author(s):  
Shinpei Yamamoto ◽  
Muhammad Ejaz ◽  
Yoshinobu Tsujii ◽  
Mutsuo Matsumoto ◽  
Takeshi Fukuda
Keyword(s):  
Atomic Force Microscopy ◽  
Chain Length ◽  
Polymer Brushes ◽  
Surface Interaction ◽  
High Density ◽  
Interaction Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic force microscopy: a novel approach to the detection of nanosized blood microparticles

2010 ◽  
Vol 8 (2) ◽  
pp. 315-323 ◽  
Author(s):  
Y. YUANA ◽  
T. H. OOSTERKAMP ◽  
S. BAHATYROVA ◽  
B. ASHCROFT ◽  
P. GARCIA RODRIGUEZ ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach

Atomic Force Microscopy of Polymer Brushes: Colloidal versus Sharp Tips

Langmuir ◽  
2010 ◽  
Vol 26 (11) ◽  
pp. 8933-8940 ◽  
Author(s):  
A. Halperin ◽  
E. B. Zhulina
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brushes ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy

Nanomaterials ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 561 ◽  
Author(s):  
Longhai Li ◽  
Xu Zhang ◽  
Hongfei Wang ◽  
Qian Lang ◽  
Haitao Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Interaction Force ◽  
Dna Duplex ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach ◽  
Experimental Values

Atomic force microscopy (AFM) can characterize nanomaterial elasticity. However, some one-dimensional nanomaterials, such as DNA, are too small to locate with an AFM tip because of thermal drift and the nonlinearity of piezoelectric actuators. In this study, we propose a novel approach to address the shortcomings of AFM and obtain the radial Young’s modulus of a DNA duplex. The elastic properties are evaluated by combining physical calculations and measured experimental results. The initial elasticity of the DNA is first assumed; based on tapping-mode scanning images and tip–sample interaction force simulations, the calculated elastic modulus is extracted. By minimizing the error between the assumed and experimental values, the extracted elasticity is assigned as the actual modulus for the material. Furthermore, tapping-mode image scanning avoids the necessity of locating the probe exactly on the target sample. In addition to elasticity measurements, the deformation caused by the tapping force from the AFM tip is compensated and the original height of the DNA is calculated. The results show that the radial compressive Young’s modulus of DNA is 125–150 MPa under a tapping force of 0.5–1.3 nN; its original height is 1.9 nm. This approach can be applied to the measurement of other nanomaterials.

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