Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4095-4101 ◽  
Author(s):  
Jie Li ◽  
Yujun He ◽  
Yimo Han ◽  
Kai Liu ◽  
Jiaping Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Direct Identification ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes

2004 ◽  
Vol 85 (1) ◽  
pp. 112-114 ◽  
Author(s):  
Alireza Nojeh ◽  
Wai-Kin Wong ◽  
Aaron W. Baum ◽  
R. Fabian Pease ◽  
Hongjie Dai
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Deposition of Various Metals on Vertically-Aligned Single-Walled Carbon Nanotubes

2007 ◽  
Author(s):  
Kei Ishikawa ◽  
Hai Duong ◽  
Junichiro Shiomi ◽  
Shigeo Maruyama
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Cohesive Energy ◽  
Layer Structure ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Vertically Aligned ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Evaporation of different metals (Au, Ti, Al and Pd) onto Vertically-Aligned Single-Walled Carbon Nanotubes (VASWNT) has been studied. Observations through Scanning Electron Microscopy (SEM) showed a clear metal-dependence of the deposition layer structure on top of the VASWNT, reflecting the variation of wettability and cohesive energy of each metal. These characteristics also influence the structures of the metal penetrated through the top surface into VASWNT film, where metal forms particles inside VASWNT film except for Ti. A simple annealing technique to remove metals penetrated in the SWNT films is demonstrated. Some peculiar morphologies found during the processes are also presented.

Preparation of Single-Walled Carbon Nanotubes from Starch by Arc Discharge

2012 ◽  
Vol 454 ◽  
pp. 63-66
Author(s):  
Xia Yuan ◽  
Yu Liang An ◽  
Chen Zhang ◽  
Hong Chao Sui
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Arc Discharge ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Transmission Electron ◽  
Walled Carbon Nanotubes ◽  
Discharge Method ◽  
Scanning Electron

Single-walled carbon nanotubes (SWNTs) have been successfully prepared from starch by arc discharge technique. The SWNTs products were characterized by scanning electron microscopy, transmission electron microscopy and Raman spectroscopy. The growth mechanism of the SWNTs was discussed in terms of the starch. The results demonstrate that starch is one of the suitable precursor for making SWNTs by arc discharge method.

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

2009 ◽  
Vol 255 (7) ◽  
pp. 4341-4346 ◽  
Author(s):  
Y.S. Zhou ◽  
K.J. Yi ◽  
M. Mahjouri-Samani ◽  
W. Xiong ◽  
Y.F. Lu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Contrast Enhancement ◽  
Field Emission ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Image Contrast Enhancement ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Mechanism of bright selective imaging of single-walled carbon nanotubes on insulators by scanning electron microscopy

2004 ◽  
Vol 84 (10) ◽  
pp. 1750-1752 ◽  
Author(s):  
Yoshikazu Homma ◽  
Satoru Suzuki ◽  
Yoshihiro Kobayashi ◽  
Masao Nagase ◽  
Daisuke Takagi
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

scholarly journals Chirality analysis of horizontally aligned single-walled carbon nanotubes: decoupling populations and lengths

2015 ◽  
Vol 3 (29) ◽  
pp. 15119-15123 ◽  
Author(s):  
Taiki Inoue ◽  
Daisuke Hasegawa ◽  
Shohei Chiashi ◽  
Shigeo Maruyama
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Raman Mapping ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Populations and lengths of single-walled carbon nanotubes with different chiralities (n,m) were evaluated by Raman mapping together with scanning electron microscopy.

Imaging defects and junctions in single-walled carbon nanotubes by voltage-contrast scanning electron microscopy

Carbon ◽  
2010 ◽  
Vol 48 (2) ◽  
pp. 494-500 ◽  
Author(s):  
Aravind Vijayaraghavan ◽  
Christoph W. Marquardt ◽  
Simone Dehm ◽  
Frank Hennrich ◽  
Ralph Krupke
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Voltage Contrast ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Scanning electron microscopy imaging of single-walled carbon nanotubes on substrates

Nano Research ◽  
2017 ◽  
Vol 10 (5) ◽  
pp. 1804-1818 ◽  
Author(s):  
Dongqi Li ◽  
Jin Zhang ◽  
Yujun He ◽  
Yan Qin ◽  
Yang Wei ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Scanning Electron Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Microscopy Imaging ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron
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