Quantification of Free-Carrier Absorption in Silicon Nanocrystals with an Optical Microcavity

Nano Letters ◽  
2008 ◽  
Vol 8 (11) ◽  
pp. 3787-3793 ◽  
Author(s):  
Rohan D. Kekatpure ◽  
Mark L. Brongersma
2009 ◽  
Vol 34 (21) ◽  
pp. 3397 ◽  
Author(s):  
Rohan D. Kekatpure ◽  
Mark L. Brongersma

2012 ◽  
Vol 1426 ◽  
pp. 395-400
Author(s):  
T. W. Roger ◽  
A. Kaplan

ABSTRACTWe present a femtosecond pump-probe ellipsometer operating over a spectral range of 1.4 – 1.7 eV with a ∼50fs time resolution. The calibration and preliminary findings of the setup are discussed. We tested the apparatus on bulk crystalline silicon (not shown here) and on silicon nanocrystals embedded in an amorphous silicon phase. The ellipsometric angles (ψ, Δ) were determined as a function of time and wavelength. The results suggest that a simple Drude model of free carrier absorption is not sufficient to explain the findings.


2021 ◽  
Vol 27 (3) ◽  
pp. 1-11
Author(s):  
Yen-Wei Hsueh ◽  
Chih-Hsien Cheng ◽  
Cai-Syuan Fu ◽  
Huai-Yung Wang ◽  
Bo-Ji Huang ◽  
...  

2004 ◽  
Vol 84 (13) ◽  
pp. 2265-2267 ◽  
Author(s):  
Joerg Isenberg ◽  
Wilhelm Warta

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