Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis

Shape Analysis ◽

Atomic Column ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission ◽

Z-contrast dependence of quantitative scanning transmission electron microscopy image of Si1−Ge binary crystals

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2014.08.230 ◽

2015 ◽

Vol 618 ◽

pp. 545-550 ◽

Cited By ~ 5

Author(s):

Suhyun Kim ◽

Younheum Jung ◽

Joong Jung Kim ◽

Sunyoung Lee ◽

Haebum Lee

Keyword(s):

Electron Microscopy ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission ◽

Identification of interdendritic phases in Ni 30Cr weld metal with additions of tantalum and molybdenum using electron diffraction pattern and high-resolution scanning transmission electron microscopy image analysis

Materials Characterization ◽

10.1016/j.matchar.2020.110460 ◽

2020 ◽

Vol 167 ◽

pp. 110460

Author(s):

Cheng-Han Li ◽

Carolin Fink ◽

John C. Lippold ◽

Joerg R. Jinschek

Keyword(s):

Electron Microscopy ◽

Image Analysis ◽

High Resolution ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission ◽

Microscopy Image Analysis

Conventional and scanning transmission electron microscopy: image contrast and radiation damage

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/8/007 ◽

1977 ◽

Vol 10 (8) ◽

pp. 1085-1107 ◽

Cited By ~ 23

Author(s):

D L Misell

Keyword(s):

Electron Microscopy ◽

Radiation Damage ◽

Image Contrast ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission

Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

Microscopy and Microanalysis ◽

10.1017/s1431927620024708 ◽

2020 ◽

pp. 1-9 ◽

Cited By ~ 1

Author(s):

Chenyu Zhang ◽

Jie Feng ◽

Andrew B. Yankovich ◽

Alexander Kvit ◽

Benjamin Berkels ◽

...

Keyword(s):

Electron Microscopy ◽

Nonrigid Registration ◽

Image Series ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission

Abstract

Atomic-Scale Imaging of Materials by Z-Contrast Scanning Transmission Electron Microscopy

Analytical Chemistry ◽

10.1021/ac00028a721 ◽

1992 ◽

Vol 64 (4) ◽

pp. 263A-272A ◽

Cited By ~ 4

Author(s):

S. J. Pennycook

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Transmission Electron ◽

Scanning Transmission ◽

Magnified pseudo-elemental map of atomic column obtained by Moiré method in scanning transmission electron microscopy

Microscopy ◽

10.1093/jmicro/dfu024 ◽

2014 ◽

Vol 63 (5) ◽

pp. 391-395 ◽

Cited By ~ 14

Author(s):

Yukihito Kondo ◽

Eiji Okunishi

Keyword(s):

Electron Microscopy ◽

Atomic Column ◽

Transmission Electron ◽

Scanning Transmission ◽

Moire Method

Scanning Transmission Electron Microscopy: Z-Contrast Imaging

Characterization of Materials ◽

10.1002/0471266965.com083 ◽

2002 ◽

Author(s):

S.J. Pennycook

Keyword(s):

Electron Microscopy ◽

Contrast Imaging ◽

Transmission Electron ◽

Scanning Transmission ◽

Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics

Ultramicroscopy ◽

10.1016/j.ultramic.2020.113124 ◽

2020 ◽

Vol 219 ◽

pp. 113124

Author(s):

Joseph Tessmer ◽

Saransh Singh ◽

Yejun Gu ◽

Jaafar A. El-Awady ◽

Marc De Graef

Keyword(s):

Electron Microscopy ◽

Dislocation Dynamics ◽

Discrete Dislocation Dynamics ◽

Discrete Dislocation ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission ◽

Image Simulations

Multislice simulation of high-resolution scanning transmission electron microscopy Z-contrast images of semiconductor heterointerfaces

Scanning ◽

10.1002/sca.1996.4950180405 ◽

2006 ◽

Vol 18 (4) ◽

pp. 291-300 ◽

Cited By ~ 4

Author(s):

B. Bollig ◽

H.-G. Fischer ◽

E. Kubalek

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Measuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927619000813 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 16-17

Author(s):

Wenpei Gao ◽

Chris Addiego ◽

Huaixun Huyan ◽

Xiaoqing Pan

Keyword(s):

Electron Microscopy ◽

Charge State ◽

Atomic Column ◽

Transmission Electron ◽

Scanning Transmission ◽

Column Base