scholarly journals Effects of dehydration on plant primary cell wall cellulose from grazing-incidence wide angle X-ray scattering

2020 ◽  
Author(s):  
Joshua Del Mundo ◽  
Sintu Rongpipi ◽  
Esther Gomez ◽  
Enrique Gomez
Keyword(s):  
Cell Wall ◽  
Grazing Incidence ◽  
Primary Cell ◽  
Primary Cell Wall ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

An instrument for time-resolved and anomalous simultaneous small- and wide-angle X-ray scattering (SWAXS) at NSRRC

2006 ◽  
Vol 39 (6) ◽  
pp. 871-877 ◽  
Author(s):  
Ying-Huang Lai ◽  
Ya-Sen Sun ◽  
U-Ser Jeng ◽  
Jhih-Min Lin ◽  
Tsang-Lang Lin ◽  
...  
Keyword(s):  
Lipid Membrane ◽  
Quantum Wires ◽  
Grazing Incidence ◽  
Anomalous Scattering ◽  
Wide Angle ◽  
Scanning Calorimetry ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A SWAXS (small- and wide-angle X-ray scattering) instrument was recently installed at the wiggler beamline BL17B3 of the National Synchrotron Radiation Research Center (NSRRC), Taiwan. The instrument, which is designed for studies of static and dynamic nanostructures and correlations between the nano (ormeso) structure (SAXS) and crystalline structure (WAXS), provides a flux of 1010–1011photon s−1at the sample at energies between 5 and 14 keV. With a SAXS area detector and a WAXS linear detector connected to two data acquisition systems operated in master–slave mode, the instrument allows one to perform time-resolved as well as anomalous scattering measurements. Data reduction algorithms have been developed for rapid processing of the large SWAXS data sets collected during time-resolved measurements. The performance of the instrument is illustrated by examples taken from different classes of ongoing projects: (i) time-resolved SAXS/WAXS/differential scanning calorimetry (DSC) with a time resolution of 10 s on a semicrystalline poly(hexamethylene terephthalate) sample, (ii) anomalous SAXS/WAXS measurements on a nanoparticulate PtRu catalyst, and (iii) grazing-incidence SAXS of a monolayer of oriented semiconductor quantum wires, and humidity-controlled ordering of Alamethicin peptides embedded in an oriented lipid membrane.

scholarly journals GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials

2020 ◽  
Vol 53 (4) ◽  
pp. 1108-1129 ◽  
Author(s):  
Victoria Savikhin ◽  
Hans-Georg Steinrück ◽  
Ru-Ze Liang ◽  
Brian A. Collins ◽  
Stefan D. Oosterhout ◽  
...  
Keyword(s):  
Organic Materials ◽  
Grazing Incidence ◽  
Peak Position ◽  
Wide Angle ◽  
Scattering Intensity ◽  
X Ray ◽  
Short Learning Curve ◽  
X Ray Scattering ◽  
Intensity Normalization ◽  
Ray Scattering

Grazing-incidence wide-angle X-ray scattering (GIWAXS) has become an increasingly popular technique for quantitative structural characterization and comparison of thin films. For this purpose, accurate intensity normalization and peak position determination are crucial. At present, few tools exist to estimate the uncertainties of these measurements. Here, a simulation package is introduced called GIWAXS-SIIRkit, where SIIR stands for scattering intensity, indexing and refraction. The package contains several tools that are freely available for download and can be executed in MATLAB. The package includes three functionalities: estimation of the relative scattering intensity and the corresponding uncertainty based on experimental setup and sample dimensions; extraction and indexing of peak positions to approximate the crystal structure of organic materials starting from calibrated GIWAXS patterns; and analysis of the effects of refraction on peak positions. Each tool is based on a graphical user interface and designed to have a short learning curve. A user guide is provided with detailed usage instruction, tips for adding functionality and customization, and exemplary files.

Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

2012 ◽  
Vol 83 (7) ◽  
pp. 076107 ◽  
Author(s):  
V. Körstgens ◽  
R. Meier ◽  
M. A. Ruderer ◽  
S. Guo ◽  
H.-Y. Chiang ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Wide Angle ◽  
X Ray ◽  
Imaging Ellipsometry ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB

2010 ◽  
Vol 81 (10) ◽  
pp. 105105 ◽  
Author(s):  
J. Perlich ◽  
J. Rubeck ◽  
S. Botta ◽  
R. Gehrke ◽  
S. V. Roth ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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