Synthesis and characterization of Mg2Si/Si nanocomposites prepared from MgH2 and silicon, and their thermoelectric properties

2012 ◽  
Vol 22 (47) ◽  
pp. 24805 ◽  
Author(s):  
Tanghong Yi ◽  
Shaoping Chen ◽  
Shawn Li ◽  
Hao Yang ◽  
Sabah Bux ◽  
...  
RSC Advances ◽  
2017 ◽  
Vol 7 (35) ◽  
pp. 21439-21445 ◽  
Author(s):  
Yu Mao ◽  
Yonggao Yan ◽  
Keping Wu ◽  
Hongyao Xie ◽  
Zekun Xiu ◽  
...  

N-type Bi2Te2.7Se0.3 material fabricated by non-equilibrium laser 3D printing exhibits comparable thermoelectric properties to that of the commercially available material.


2000 ◽  
Vol 626 ◽  
Author(s):  
Duck-Young Chung ◽  
Tim P. Hogan ◽  
Nishant Ghelani ◽  
Paul W. Brazis ◽  
Melissa A. Lane ◽  
...  

ABSTRACTResults on the synthesis and characterization of the solid solutions CsBi4-xSbxTe6, CsBi4Te6-ySey, as well as doping experiments on CsBi4Te6 are reported. We report X-ray structural investigations showing that the Sb or Se atoms in these compounds are not uniformly distributed in the lattice but show preferential occupation of specific crystallographic sites. Thermoelectric properties of selected systems are presented.


2010 ◽  
Vol 50 (6) ◽  
pp. 1363-1366 ◽  
Author(s):  
Jae Sung Son ◽  
Kunsu Park ◽  
Mi-Kyung Han ◽  
Chanyoung Kang ◽  
Sung-Geun Park ◽  
...  

2010 ◽  
Vol 123 (6) ◽  
pp. 1399-1402 ◽  
Author(s):  
Jae Sung Son ◽  
Kunsu Park ◽  
Mi-Kyung Han ◽  
Chanyoung Kang ◽  
Sung-Geun Park ◽  
...  

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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