Modular logic gates: cascading independent logic gates via metal ion signals

AbstractThe affinity of metal ions for DNA is logical considering that the structure of DNA includes a phosphate backbone with a net-negative charge, a deoxyribose sugar with O atoms, and purine and pyrimidine bases that contain O and N atoms. DNA-metal ion interactions encompass a large area of research that ranges from the most fundamental characterization of DNA-metal ion binding to the role of DNA-bound metal ions in disease and human health. Alternative DNA base pairing mediated by metal binding is also being investigated and manipulated for applications in logic gates, molecular machines, and nanotechnology. This review highlights recent work aimed at understanding interactions of redox-active metal ions with DNA that provides a better understanding of the mechanisms by which various types of oxidative DNA damage (strand breakage and base modifications) occur. Antioxidants that mitigate oxidative DNA damage by coordinating metal ions that produce reactive oxygen species are addressed, as well as recent work on the effect of DNA-metal ion interactions and the efficacy of quinolone-based antibacterial drugs. Recent advances in metal-mediated base pairing that triggers conformational changes in DNA structure for use as selective metal ion sensors and novel nanotechnology applications are also included.

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DNA Electronic Logic Gates Based on Metal-Ion-Dependent Induction of Oligonucleotide Structural Motifs

Chemistry - A European Journal ◽

10.1002/chem.201300625 ◽

2013 ◽

Vol 19 (22) ◽

pp. 6961-6965 ◽

Cited By ~ 24

Author(s):

Yun-Mei Zhang ◽

Li Zhang ◽

Ru-Ping Liang ◽

Jian-Ding Qiu

Keyword(s):

Metal Ion ◽

Logic Gates ◽

Structural Motifs ◽

Electronic Logic

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A dipodal molecular probe for naked eye detection of trivalent cations (Al3+, Fe3+and Cr3+) in aqueous medium and its applications in real sample analysis and molecular logic gates

RSC Advances ◽

10.1039/c8ra07041e ◽

2018 ◽

Vol 8 (63) ◽

pp. 35946-35958 ◽

Cited By ~ 13

Author(s):

Rukmani Chandra ◽

Amit Kumar Manna ◽

Kalyani Rout ◽

Jahangir Mondal ◽

Goutam K. Patra

Keyword(s):

Metal Ion ◽

Logic Gates ◽

Molecular Probe ◽

Practical Application ◽

Trivalent Metal ◽

Real Sample Analysis ◽

Molecular Logic ◽

Molecular Logic Gates ◽

Trivalent Cations ◽

Naked Eye Detection

A dipodal reversible colorimetric trivalent metal ion chemosensor (L) has been designed and synthesized. The chemosensor L successfully detects Al3+, Fe3+ and Cr3+ based on binding site-signaling approach and it has practical application.

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S,N-Co-doped carbon nanoparticles with high quantum yield for metal ion detection, IMP logic gates and bioimaging applications

New Journal of Chemistry ◽

10.1039/c8nj04527e ◽

2018 ◽

Vol 42 (24) ◽

pp. 20180-20189 ◽

Cited By ~ 2

Author(s):

Jinping Song ◽

Qi Ma ◽

Sufang Zhang ◽

Huijun Liu ◽

Yong Guo ◽

...

Keyword(s):

Quantum Yield ◽

Carbon Nanoparticles ◽

Metal Ion ◽

Logic Gate ◽

Logic Gates ◽

High Quantum Yield ◽

Ion Detection ◽

High Quantum ◽

Metal Ion Detection ◽

Co Doped

S,N-CNPs with high quantum yield exhibited potential multiple applications including metal ion detection, IMP logic gate fabrication and bioimaging.

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Photonic logic gates based on metal ion and proton induced multiple outputs in 5-chloro-8-hydroxyquinoline based tetrapod

New Journal of Chemistry ◽

10.1039/b607524j ◽

2006 ◽

Vol 30 (11) ◽

pp. 1553 ◽

Cited By ~ 25

Author(s):

Prabhpreet Singh ◽

Subodh Kumar

Keyword(s):

Metal Ion ◽

Logic Gates ◽

Multiple Outputs

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Aspects of high-resolution imaging with a scanning ion microprobe

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014511x ◽

1986 ◽

Vol 44 ◽

pp. 750-751

Author(s):

R. Levi-Setti ◽

J. M. Chabala ◽

Y. L. Wang

Keyword(s):

Metal Ion ◽

Secondary Ion Mass Spectrometry ◽

Chromatic Aberration ◽

Ion Source ◽

Ion Microprobe ◽

Emission Pattern ◽

Intrinsic Resolution ◽

Resolution Imaging ◽

20 Nm ◽

Secondary Ion

We have shown the feasibility of 20 nm lateral resolution in both topographic and elemental imaging using probes of this size from a liquid metal ion source (LMIS) scanning ion microprobe (SIM). This performance, which approaches the intrinsic resolution limits of secondary ion mass spectrometry (SIMS), was attained by limiting the size of the beam defining aperture (5μm) to subtend a semiangle at the source of 0.16 mr. The ensuing probe current, in our chromatic-aberration limited optical system, was 1.6 pA with Ga+ or In+ sources. Although unique applications of such low current probes have been demonstrated,) the stringent alignment requirements which they imposed made their routine use impractical. For instance, the occasional tendency of the LMIS to shift its emission pattern caused severe misalignment problems.

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Scanning ion microscopy images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010012583x ◽

1987 ◽

Vol 45 ◽

pp. 180-181

Author(s):

R. Levi-Setti ◽

J.M. Chabala ◽

Y.L. Wang

Keyword(s):

Metal Ion ◽

Secondary Emission ◽

Scanning Method ◽

Ion Channeling ◽

Secondary Ions ◽

High Resolution Images ◽

Ion Microscopy ◽

Z Contrast ◽

Focused Beams ◽

Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

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