In situ high temperature X-ray diffraction, transmission electron microscopy and theoretical modeling for the formation of WO3 crystallites

CrystEngComm ◽  
2015 ◽  
Vol 17 (36) ◽  
pp. 6985-6998 ◽  
Author(s):  
Suman Pokhrel ◽  
Johannes Birkenstock ◽  
Arezoo Dianat ◽  
Janina Zimmermann ◽  
Marco Schowalter ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
High Temperatures ◽  
Structural Transformation ◽  
Theoretical Modeling ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

The structural transformation of WO3 at high temperatures.

In situ x-ray study of the γ- to α-Al2O3 phase transformation during atmospheric pressure oxidation of NiAl(110)

2006 ◽  
Vol 21 (12) ◽  
pp. 3047-3057 ◽  
Author(s):  
A. Vlad ◽  
A. Stierle ◽  
N. Kasper ◽  
H. Dosch ◽  
M. Rühle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Orientation Relationship ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Oxidation In Air ◽  
Α Al2o3 ◽  
Underlying Substrate

The oxidation in air of NiAl(110) was investigated in the temperature range from 870 °C–1200 °C by in situ x-ray diffraction and transmission electron microscopy. Oxidation at 870 °C and 1 bar oxygen leads to the formation of an epitaxial layer of γ-alumina showing an R30° orientation relationship with respect to the underlying substrate. At oxidation temperatures between 950 °C and 1025 °C, we observed a coexistence of epitaxial γ- and polycrystalline δ-Al2O3. The α-Al2O3 starts to form at 1025 °C and the complete transformation of metastable phases to the stable α-alumina phase takes place at 1100 °C. The fcc-hcp martensitic-like transformation of the initial γ-Al2O3 to epitaxial α-Al2O3 was observed. X-ray diffraction and cross-section transmission electron microscopy proved the existence of a continuous epitaxial α-Al2O3 layer between the substrate and the polycrystalline oxide scale, having a thickness of about 150 nm. The relative orientation relationship between the epitaxial alumina and the underlying substrate was found to be NiAl(110) || α-Al2O3 (0001) and [110] NiAl || [1120].

Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

2020 ◽  
Vol 98 (5) ◽  
pp. 365-375
Author(s):  
Andrea Quintero ◽  
Patrice Gergaud ◽  
Jean-Michel Hartmann ◽  
Vincent Delaye ◽  
Nicolas Bernier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron
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