Evolution of Cu-Zn-Si oxide catalysts in the course of reduction and reoxidation as studied by in situ X-ray diffraction analysis, transmission electron microscopy, and magnetic susceptibility methods

2008 ◽  
Vol 49 (6) ◽  
pp. 821-830 ◽  
Author(s):  
T. P. Minyukova ◽  
N. V. Shtertser ◽  
A. A. Khassin ◽  
L. M. Plyasova ◽  
G. N. Kustova ◽  
...  
2006 ◽  
Vol 21 (12) ◽  
pp. 3047-3057 ◽  
Author(s):  
A. Vlad ◽  
A. Stierle ◽  
N. Kasper ◽  
H. Dosch ◽  
M. Rühle

The oxidation in air of NiAl(110) was investigated in the temperature range from 870 °C–1200 °C by in situ x-ray diffraction and transmission electron microscopy. Oxidation at 870 °C and 1 bar oxygen leads to the formation of an epitaxial layer of γ-alumina showing an R30° orientation relationship with respect to the underlying substrate. At oxidation temperatures between 950 °C and 1025 °C, we observed a coexistence of epitaxial γ- and polycrystalline δ-Al2O3. The α-Al2O3 starts to form at 1025 °C and the complete transformation of metastable phases to the stable α-alumina phase takes place at 1100 °C. The fcc-hcp martensitic-like transformation of the initial γ-Al2O3 to epitaxial α-Al2O3 was observed. X-ray diffraction and cross-section transmission electron microscopy proved the existence of a continuous epitaxial α-Al2O3 layer between the substrate and the polycrystalline oxide scale, having a thickness of about 150 nm. The relative orientation relationship between the epitaxial alumina and the underlying substrate was found to be NiAl(110) || α-Al2O3 (0001) and [110] NiAl || [1120].


Author(s):  
Е.В. Астрова ◽  
А.В. Парфеньева ◽  
А.М. Румянцев ◽  
В.П. Улин ◽  
М.В. Байдакова ◽  
...  

The effect of annealing temperature in argon atmosphere on the ability of Si-C nanocomposites to reversibly insert lithium was investigated. It was found that the higher the annealing temperature during the formation of the composite, the lower is the capacitance of the electrode made from it. X-ray diffraction analysis and transmission electron microscopy reveal that the reason of the capacitance decrease is formation at T  1100°C of silicon carbide of cubic modification -SiC, inactive with respect to the formation of lithium alloys or intercalates.


1990 ◽  
Vol 209 ◽  
Author(s):  
M. Griffiths ◽  
J.E. Winegar

ABSTRACTThe techniques employed for X-ray diffraction analysis of dislocation substructures in hexagonal close-packed metals are descibed and assessed by comparison with direct observations using transmission electron microscopy.


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