Retracted Article: Insights from investigations of tin dioxide and its composites: electron-beam irradiation, fractal assessment, and mechanism

Nanoscale ◽  
2015 ◽  
Vol 7 (38) ◽  
pp. 15532-15552 ◽  
Author(s):  
Zhiwen Chen ◽  
Chan-Hung Shek ◽  
C. M. Lawrence Wu

In this review, we describe the efforts toward understanding the synthetic strategies, microstructural evolution and performance evaluation of tin dioxide (SnO2) functional materials by electron-beam irradiation, fractal assessment, and SnO2 planted graphene.

Nanoscale ◽  
2018 ◽  
Vol 10 (24) ◽  
pp. 11616-11623 ◽  
Author(s):  
Natasha Goyal ◽  
Naveen Kaushik ◽  
Himani Jawa ◽  
Saurabh Lodha

The effect of e-beam irradiation on few layer black phosphorus transistor performance has been studied experimentally in this report. An improvement in device characteristics in terms of better stability, higher on-current, reduced threshold voltage and better mobility is observed post e-beam exposure.


2008 ◽  
Vol 31 (1) ◽  
pp. 83-86 ◽  
Author(s):  
Zheng Jiao ◽  
Xiaojuan Wan ◽  
Bing Zhao ◽  
Huijiao Guo ◽  
Tiebing Liu ◽  
...  

2011 ◽  
Vol 115 (42) ◽  
pp. 20523-20528 ◽  
Author(s):  
Jian Wang ◽  
Juan Du ◽  
Chen Chen ◽  
Zhen Li ◽  
Zheng Jiao ◽  
...  

2011 ◽  
Vol 11 (11) ◽  
pp. 9709-9713 ◽  
Author(s):  
Juan Du ◽  
Jian Wang ◽  
Zheng Jiao ◽  
Minghong Wu ◽  
C. H. Shek ◽  
...  

Nanoscale ◽  
2017 ◽  
Vol 9 (35) ◽  
pp. 13343-13343
Author(s):  
Annie Harvey

Retraction of ‘Insights from investigations of tin dioxide and its composites: electron-beam irradiation, fractal assessment, and mechanism’ by Zhiwen Chen et al., Nanoscale, 2015, 7, 15532–15552.


RSC Advances ◽  
2015 ◽  
Vol 5 (52) ◽  
pp. 41563-41575 ◽  
Author(s):  
Joyeeta Dutta ◽  
Tuhin Chatterjee ◽  
Gopal Dhara ◽  
Kinsuk Naskar

Investigation of electron beam irradiated EVA/TPU blends leads to significant improvements in performance properties suitable for various technological applications.


2021 ◽  
Vol 152 ◽  
pp. 106119
Author(s):  
Pengfei Liu ◽  
Fengfen Mao ◽  
Dean C. Webster ◽  
Xiaoya Liu ◽  
Ren Liu

Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.


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