Scattering experiments with fast hydrogen atoms. Velocity dependence of the integral elastic cross section with the rare gases in the energy range 0.01–1.00 eV

1973 ◽  
Vol 55 (0) ◽  
pp. 167-178 ◽  
Author(s):  
R. W. Bickes ◽  
B. Lantzsch ◽  
J. P. Toennies ◽  
K. Walaschewski
1985 ◽  
Vol 63 (10) ◽  
pp. 1274-1277
Author(s):  
R. J. W. Hodgson

A prescription for separating the elastic cross section into its coherent and incoherent parts is used to gain more information about the excitation function at 90° and at 180°. Approximations become useless over most of the energy range owing to the extreme sensitivity of the cross section. Despite the apparent smooth energy dependence of the coherent and incoherent parts, interpolation does not generate the observed structure in the excitation functions.


1976 ◽  
Vol 31 (3-4) ◽  
pp. 395-396 ◽  
Author(s):  
G. Willems

The differential elastic cross sections for K+ - Ar, Kr and Xe were measured in the energy range from 2.2 eV to 5.0 eV in the laboratory system and compared with those predicted by the theory of Kim and Gordon. The experimental well depths are smaller than predicted by this theory.


1971 ◽  
Vol 26 (4) ◽  
pp. 689-692 ◽  
Author(s):  
H. Kanes ◽  
H. Pauly ◽  
E. Vletzke

Abstract The velocity dependence of the total collision cross section has been measured for the system LiCs in the energy range from 15-1000 eV. Using the observed glory undulation together with spectroscopic data a potential for the singlet ground state of LiCs is proposed.


Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.


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