scholarly journals A built-in-test circuit for functional verification & PVT variations monitoring of CMOS RF circuits

Author(s):  
G. Zhang ◽  
M.S. Mora ◽  
R. Farrell
1998 ◽  
Vol 33 (7) ◽  
pp. 1023-1036 ◽  
Author(s):  
Q. Huang ◽  
F. Piazza ◽  
P. Orsatti ◽  
T. Ohguro

2014 ◽  
Vol 39 (12) ◽  
pp. 8935-8946
Author(s):  
Abdellah Idrissi Ouali ◽  
Ahmed El Oualkadi ◽  
Mohamed Moussaoui ◽  
Yassin Laaziz

Author(s):  
Kris Iniewski ◽  
Mourad El-Gamal ◽  
Robert Bogdan Staszewski

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