Erbium-doped waveguide fabrication via reactive pulsed laser deposition of erbium-doped oxyfluoride-silicate glass

2005 ◽  
Vol 41 (25) ◽  
pp. 1376 ◽  
Author(s):  
R.R. Thomson ◽  
H.T. Bookey ◽  
A.K. Kar ◽  
M.R. Taghizadeh ◽  
A. Klini ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Silicate Glass ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Erbium Doped ◽  
Waveguide Fabrication

OPTICAL WAVEGUIDE FABRICATION AND REFRACTIVE INDEX CHARACTERIZATION OF Nd:LuVO4 THIN FILMS BY PULSED LASER DEPOSITION

2007 ◽  
Vol 14 (06) ◽  
pp. 1079-1082 ◽  
Author(s):  
HONGXIA LI ◽  
XIN WU ◽  
RENGUO SONG ◽  
JIYANG WANG
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Pulsed Laser Deposition ◽  
Silica Glass ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Propagation Mode ◽  
Glass Substrates ◽  
Oriented Polycrystalline ◽  
Waveguide Fabrication

High-quality Nd:LuVO 4 thin films have been grown on silica glass substrates by using a pulsed laser deposition technique. X-ray diffraction results show that the as-deposited Nd:LuVO 4 film is basically oriented polycrystalline, and strong (200) peak was revealed. The waveguide property was characterized by the prism-coupling method. The refractive index of the propagation mode is higher than that of the silica glass substrate which means that the dips correspond to real propagation mode, where the light could be well defined. The surface morphology of the deposited Nd:LuVO 4 films was also observed by using an atomic force microscopy.

Epitaxy of Erbium Doped LiNbO3 Films Produced by Pulsed Laser Deposition

1994 ◽  
Vol 341 ◽  
Author(s):  
S. Bauer ◽  
L. Beckers ◽  
M. Fleuster ◽  
J. Schubert ◽  
W. Zander ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Erbium Doped ◽  
Film Preparation ◽  
Er Doped ◽  
Secondary Ion

AbstractThe growth of thin films of LiNbO3 and Er:LiNbO3 on LiNbO3 single crystals produced by pulsed laser deposition (PLD) was studied. Samples were characterized by RBS/Channeling Spectrometry, X-ray diffraction measurements, Secondary Ion Mass Spectroscopy (SIMS) and photoluminescence (PL) measurements. Film preparation is performed in a two-step process including deposition and in-situ-annealing. Buried Er doped layers of approx. 800 nm thickness were grown.

scholarly journals Erbium-doped yttria-stabilised zirconia thin films grown by pulsed laser deposition for photonic applications

2020 ◽  
Vol 693 ◽  
pp. 137706
Author(s):  
A. Ruiz-Caridad ◽  
G. Marcaud ◽  
J.M. Ramirez ◽  
E. Durán-Valdeiglesias ◽  
C. Lafforgue ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Erbium Doped

scholarly journals Erbium-doped glass nanoparticle embedded polymer thin films using femtosecond pulsed laser deposition

2018 ◽  
Vol 8 (7) ◽  
pp. 1997 ◽  
Author(s):  
Eric Kumi Barimah ◽  
Marcin W. Ziarko ◽  
Nikolaos Bamiedakis ◽  
Ian H. White ◽  
Richard V. Penty ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Polymer Thin Films ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Erbium Doped ◽  
Doped Glass ◽  
Femtosecond Pulsed Laser
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