Improved objective function for device model parameter extraction

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1992.0021 ◽

1992 ◽

Vol 139 (1) ◽

pp. 126

Author(s):

M.G. Middelhoek

Keyword(s):

Objective Function ◽

Parameter Extraction ◽

Model Parameter ◽

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GOPDE: global optimization in small signal device model parameter extraction

Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94 ◽

10.1109/iscas.1994.408819 ◽

2002 ◽

Author(s):

Dongfeng Zhao ◽

R.R. Chen

Keyword(s):

Global Optimization ◽

Parameter Extraction ◽

Small Signal ◽

Model Parameter ◽

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Parasitic series resistance-independent method for device-model parameter extraction

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:19960159 ◽

1996 ◽

Vol 143 (1) ◽

pp. 68 ◽

Author(s):

F.J. García Sánchez ◽

A. Ortiz–Conde ◽

J.J. Liou

Keyword(s):

Series Resistance ◽

Parameter Extraction ◽

Independent Method ◽

Model Parameter ◽

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RF GaN Device Model Survey and Model Parameter Extraction Flows

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278132 ◽

2020 ◽

Author(s):

Raj Sodhi ◽

Roberto Tinti ◽

Mark Dunn ◽

Ma Long

Keyword(s):

Parameter Extraction ◽

Model Parameter ◽

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Genetic Algorithm and Semiconductor Device Model Parameter Extraction

2009 Third International Conference on Genetic and Evolutionary Computing ◽

10.1109/wgec.2009.92 ◽

2009 ◽

Author(s):

Feng-bo Fang ◽

Tao Wu

Keyword(s):

Genetic Algorithm ◽

Semiconductor Device ◽

Parameter Extraction ◽

Model Parameter ◽

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Effects of Random Number Generations on Intelligent Semiconductor Device Model Parameter Extraction

10.1063/1.3117138 ◽

2009 ◽

Author(s):

Yiming Li ◽

George Maroulis ◽

Theodore E. Simos

Keyword(s):

Random Number ◽

Semiconductor Device ◽

Parameter Extraction ◽

Model Parameter ◽

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A Program for Device Model Parameter Extraction from Gate Capacitance and Current of Ultrathin$hboxSiO_2$and High-$kappa$Gate Stacks

IEEE Transactions on Electron Devices ◽

10.1109/ted.2006.880373 ◽

2006 ◽

Vol 53 (9) ◽

pp. 2118-2127 ◽

Author(s):

F. Li ◽

L.F. Register ◽

M.M. Hasan ◽

S.K. Banerjee

Keyword(s):

Parameter Extraction ◽

Gate Stacks ◽

Model Parameter ◽

Gate Capacitance ◽

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Nonlinear Transistor Model Parameter Extraction Techniques

10.1017/cbo9781139014960 ◽

2009 ◽

Keyword(s):

Parameter Extraction ◽

Extraction Techniques ◽

Model Parameter ◽

Transistor Model

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Automatic Device Model Parameter Extractions via Hybrid Intelligent Methodology

2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.23919/sispad49475.2020.9241613 ◽

2020 ◽

Author(s):

Cheng-Che Liu ◽

Yiming Li ◽

Ya-Shu Yang ◽

Chieh-Yang Chen ◽

Min-Hui Chuang

Keyword(s):

Automatic Device ◽

Model Parameter ◽

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On integration-based methods for MOSFET model parameter extraction

2008 9th International Conference on Solid-State and Integrated-Circuit Technology ◽

10.1109/icsict.2008.4734566 ◽

2008 ◽

Author(s):

Adelmo Ortiz-Conde ◽

Francisco J. Garcia Sanchez ◽

Ramon Salazar

Keyword(s):

Parameter Extraction ◽

Model Parameter

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Statistical Compact Model Parameter Extraction by Direct Fitting to Variations

IEEE Transactions on Electron Devices ◽

10.1109/ted.2008.922491 ◽

2008 ◽

Vol 55 (6) ◽

pp. 1487-1493 ◽

Author(s):

Kiyoshi Takeuchi ◽

Masami Hane

Keyword(s):

Parameter Extraction ◽

Compact Model ◽

Model Parameter

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